Zobrazeno 1 - 10
of 24
pro vyhledávání: '"Frans Verbeyst"'
Publikováno v:
2015 IEEE MTT-S International Microwave Symposium.
Numerous wide-bandwidth and multi-channel applications benefit from accurate test and measurement equipment which minimize the distortion of the generated and analyzed signals. Different techniques are described in literature to achieve this for Vect
Autor:
D.R. Scherrer, A. Cognata, Jan Verspecht, Jonathan B. Scott, M.L. Thorn, M. Vanden Bossche, B. Behnia, Frans Verbeyst
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques. 50:3022-3028
We have measured the output waveshape and rise time of two high-speed digital circuits on a wafer using a 50-GHz prototype of a new instrument. The instrument uses vector error correction to de-embed the component under test like a network analyzer,
Publikováno v:
2014 International Workshop on Integrated Nonlinear Microwave and Millimetre-wave Circuits (INMMiC).
In order to accurately calibrate large-signal measurement instruments at RF and microwave frequencies, periodic pulse-shaped signals are used. However, when performing modulated measurements, the repetition rate of this pulse-shaped signal has to be
Publikováno v:
82nd ARFTG Microwave Measurement Conference.
To address the challenge of the phase calibration of modulated RF and microwave signals or the response of a linear or nonlinear system under modulated excitation, a next-generation comb generator is characterized. The latter allows kHz-level modulat
Publikováno v:
81st ARFTG Microwave Measurement Conference.
When calibrating instrumentation used for measurements at RF and microwave frequencies, periodic pulse-shaped signals are used during phase calibration. However to support measurements of narrowband (a few % of the carrier frequency) signals, the rep
Publikováno v:
75th ARFTG Microwave Measurement Conference.
In this paper we report for the first time on order reduction applied to S-functions behavioral models. The most dominant model parameters are selected based on the relative uncertainty of their estimated values evaluated against a threshold value. T
Publikováno v:
2009 74th ARFTG Microwave Measurement Conference.
In this paper we report for the first time on the extraction of a S-functions behavioral model from modulated large-signal network analyzer measurements. The model parameters are directly obtained from the measurements without any additional optimiza
Publikováno v:
2006 IEEE MTT-S International Microwave Symposium Digest.
Large signal analyzers measure calibrated waves. Besides the classical linear SOLT-calibration, this requires two additional calibration steps : a power and a phase calibration over frequency. Nowadays phase relations can be calibrated with a frequen
Publikováno v:
60th ARFTG Conference Digest, Fall 2002..
There is a growing need for measuring the large signal (nonlinear) behavior of devices in their nonlinear regions under excitation of complex modulated signal schemes, as commonly used in telecom applications. The large-signal network analyzer (LSNA)
Autor:
M.L. Thorn, Frans Verbeyst, D.R. Scherrer, A. Cognata, Marc vanden Bossche, B. Behnia, Jonathan B. Scott, Jan Verspecht
Publikováno v:
2002 IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278).
A new instrument for time-domain characterization of circuits is illustrated. We measure output waveshape and rise time of two high-speed digital circuits on wafer, using a 50 GHz prototype of the new instrument. It uses vector error-correction to de