SparseAlign: A Super-Resolution Algorithm for Automatic Marker Localization and Deformation Estimation in Cryo-Electron Tomography

Autor: Ganguly, Poulami Somanya, Lucka, Felix, Kohr, Holger, Franken, Erik, Hupkes, Hermen Jan, Batenburg, K Joost

Tilt-series alignment is crucial to obtaining high-resolution reconstructions in cryo-electron tomography. Beam-induced local deformation of the sample is hard to estimate from the low-contrast sample alone, and often requires fiducial gold bead mark

Externí odkaz: http://arxiv.org/abs/2201.08706

Left-invariant Stochastic Evolution Equations on SE(2) and its Applications to Contour Enhancement and Contour Completion via Invertible Orientation Scores

Autor: Duits, Remco, Franken, Erik

We provide the explicit solutions of linear, left-invariant, (convection)-diffusion equations and the corresponding resolvent equations on the 2D-Euclidean motion group SE(2). These diffusion equations are forward Kolmogorov equations for stochastic

Externí odkaz: http://arxiv.org/abs/0711.0951

SparseAlign: A grid-free algorithm for automatic marker localization and deformation estimation in cryo-electron tomography

Autor: Ganguly, Poulami Somanya, Lucka, Felix, Kohr, Holger, Franken, Erik, Hupkes, Hermen Jan, Batenburg, Kees Joost

Publikováno v: IEEE Transactions on Computational Imaging, 8, 651-665
IEEE Transactions on Computational Imaging, 8, 651-665. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
IEEE Transactions on Computational Imaging

Tilt-series alignment is crucial to obtaining high-resolution reconstructions in cryo-electron tomography. Beam-induced local deformation of the sample is hard to estimate from the low-contrast sample alone, and often requires fiducial gold bead mark

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1f09acc9cc787e4fdda4577654d1c320
https://ir.cwi.nl/pub/31992

LEFT-INVARIANT PARABOLIC EVOLUTIONS ON SE(2) AND CONTOUR ENHANCEMENT VIA INVERTIBLE ORIENTATION SCORES PART II: NONLINEAR LEFT-INVARIANT DIFFUSIONS ON INVERTIBLE ORIENTATION SCORES

Autor: DUITS, REMCO, FRANKEN, ERIK

Publikováno v: Quarterly of Applied Mathematics, 2010 Jun 01. 68(2), 293-331.

Externí odkaz: https://www.jstor.org/stable/43638930

Foil-hole and data image quality assessment in 3DEM: Towards high-throughput image acquisition in the electron microscope

Autor: José María Carazo, Abraham J. Koster, Josué Gómez-Blanco, Javier Vargas, R. Schoenmakers, Franken Erik Michiel, Carlos Oscar S. Sorzano

Publikováno v: Journal of Structural Biology, 196(3), 515-524

Automatic or semiautomatic data collection approaches on a transmission electron microscope (TEM) for Single Particle Analysis, capable of acquiring large datasets composed of only high quality images, are of great importance to obtain 3D density map

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::508d588a9dbe495b02138aade54f7448
http://hdl.handle.net/1887/113476