Zobrazeno 1 - 10
of 56
pro vyhledávání: '"Frank Seiboth"'
Autor:
Christina Ossig, Christian Strelow, Jan Flügge, Svenja Patjens, Jan Garrevoet, Kathryn Spiers, Jackson L. Barp, Jr., Johannes Hagemann, Frank Seiboth, Michele De Bastiani, Erkan Aydin, Furkan H. Isikgor, Stefaan De Wolf, Gerald Falkenberg, Alf Mews, Christian G. Schroer, Tobias Kipp, Michael E. Stuckelberger
Publikováno v:
PRX Energy, Vol 3, Iss 2, p 023011 (2024)
Multimodal x-ray microscopy is key to assessing the property-functionality relationships of semiconductor devices with the utmost sensitivity and spatial resolution. Here, we report on a novel setup—the “Analyzer of X-ray excited Optical Luminesc
Externí odkaz:
https://doaj.org/article/aafdc750cc3f4c999cf9cafe66b008ea
Autor:
Giovanni Fevola, Christina Ossig, Mariana Verezhak, Jan Garrevoet, Harvey L. Guthrey, Martin Seyrich, Dennis Brückner, Johannes Hagemann, Frank Seiboth, Andreas Schropp, Gerald Falkenberg, Peter S. Jørgensen, Azat Slyamov, Zoltan I. Balogh, Christian Strelow, Tobias Kipp, Alf Mews, Christian G. Schroer, Shiro Nishiwaki, Romain Carron, Jens W. Andreasen, Michael E. Stuckelberger
Publikováno v:
Advanced Science, Vol 11, Iss 2, Pp n/a-n/a (2024)
Abstract Small voids in the absorber layer of thin‐film solar cells are generally suspected to impair photovoltaic performance. They have been studied on Cu(In,Ga)Se2 cells with conventional laboratory techniques, albeit limited to surface characte
Externí odkaz:
https://doaj.org/article/47a5b53e986041d0b480c3c5db3bebed
Autor:
Frank Seiboth, Andreas Schropp, Maria Scholz, Felix Wittwer, Christian Rödel, Martin Wünsche, Tobias Ullsperger, Stefan Nolte, Jussi Rahomäki, Karolis Parfeniukas, Stylianos Giakoumidis, Ulrich Vogt, Ulrich Wagner, Christoph Rau, Ulrike Boesenberg, Jan Garrevoet, Gerald Falkenberg, Eric C. Galtier, Hae Ja Lee, Bob Nagler, Christian G. Schroer
Publikováno v:
Nature Communications, Vol 8, Iss 1, Pp 1-5 (2017)
X-ray optics are notoriously challenging to fabricate due to the strict tolerances that result from the short wavelength of radiation. Here, Seibothet al. carefully quantify aberrations in complex X-ray lenses and correct them with an easy-to-fabrica
Externí odkaz:
https://doaj.org/article/8a89f31f22b74040a6c82fcd943e41bd
Autor:
Christina Ossig, Christian Strelow, Jan Flügge, Andreas Kolditz, Jan Siebels, Jan Garrevoet, Kathryn Spiers, Martin Seyrich, Dennis Brückner, Niklas Pyrlik, Johannes Hagemann, Frank Seiboth, Andreas Schropp, Romain Carron, Gerald Falkenberg, Alf Mews, Christian G. Schroer, Tobias Kipp, Michael E. Stuckelberger
Publikováno v:
Materials, Vol 14, Iss 5, p 1189 (2021)
In the original version of our article [...]
Externí odkaz:
https://doaj.org/article/27a24a3621f544469c2127986f87230a
Autor:
Christina Ossig, Christian Strelow, Jan Flügge, Andreas Kolditz, Jan Siebels, Jan Garrevoet, Kathryn Spiers, Martin Seyrich, Dennis Brückner, Niklas Pyrlik, Johannes Hagemann, Frank Seiboth, Andreas Schropp, Romain Carron, Gerald Falkenberg, Alf Mews, Christian G. Schroer, Tobias Kipp, Michael E. Stuckelberger
Publikováno v:
Materials, Vol 14, Iss 1, p 228 (2021)
Inhomogeneities and defects often limit the overall performance of thin-film solar cells. Therefore, sophisticated microscopy approaches are sought to characterize performance and defects at the nanoscale. Here, we demonstrate, for the first time, th
Externí odkaz:
https://doaj.org/article/0c69c4c0eabe4fe0aa09dcfa4f0677d3
Autor:
Frank, Seiboth, Adam, Kubec, Andreas, Schropp, Sven, Niese, Peter, Gawlitza, Jan, Garrevoet, Vanessa, Galbierz, Silvio, Achilles, Svenja, Patjens, Michael E, Stuckelberger, Christian, David, Christian G, Schroer
Publikováno v:
Optics express. 30(18)
Diffraction-limited hard X-ray optics are key components for high-resolution microscopy, in particular for upcoming synchrotron radiation sources with ultra-low emittance. Diffractive optics like multilayer Laue lenses (MLL) have the potential to rea
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::5f28b2f48e96f891c302fe1c80084112
https://pubmed.ncbi.nlm.nih.gov/36242232
https://pubmed.ncbi.nlm.nih.gov/36242232
Autor:
Andreas Schropp, Silvio Achilles, Svenja Patjens, Frank Seiboth, Michael E. Stückelberger, Zhimin Jiang, James H. Pikul, Christian G. Schroer
Publikováno v:
Developments in X-Ray Tomography XIV.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ffc784f9ba962d3d161dd0ecf45ddb19
https://doi.org/10.1117/12.2632619
https://doi.org/10.1117/12.2632619
Autor:
Niklas Pyrlik, Christina Ossig, Giovanni Fevola, Svenja Patjens, Jan Hense, Catharina Ziska, Martin Seyrich, Frank Seiboth, Andreas Schropp, Jan Garrevoet, Gerald Falkenberg, Christian G. Schroer, Romain Carron, Michael E. Stuckelberger
Publikováno v:
2022 IEEE 49th Photovoltaics Specialists Conference (PVSC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3a89e80800bf7597becbd98b3e9a3260
https://doi.org/10.1109/pvsc48317.2022.9938960
https://doi.org/10.1109/pvsc48317.2022.9938960
Autor:
Svenja Patjens, Gerald Falkenberg, Catharina Ziska, Jackson Barp, Jan Hense, Martin Seyrich, Frank Seiboth, Michael Stuckelberger, Johannes Hagemann, Giovanni Fevola, Gero Falkenberg, Mikhail Lyubomirskiy, Christina Ossig, Jan Garrevoet, Niklas Pyrlik
Publikováno v:
2021 IEEE 48th Photovoltaic Specialists Conference (PVSC).
A fully encapsulated c-Si solar cell was evaluated using focused X-ray and laser beams to probe the microscopic electrical performance and composition. Particular emphasis was placed on the influence of the silver fingers on the laser (LBIC) and X-ra
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5506233c33db6f95f80735910498b2be
https://doi.org/10.1109/pvsc43889.2021.9518800
https://doi.org/10.1109/pvsc43889.2021.9518800
Autor:
Stuckelberger, Christina Ossig, Christian Strelow, Jan Flügge, Andreas Kolditz, Jan Siebels, Jan Garrevoet, Kathryn Spiers, Martin Seyrich, Dennis Brückner, Niklas Pyrlik, Johannes Hagemann, Frank Seiboth, Andreas Schropp, Romain Carron, Gerald Falkenberg, Alf Mews, Christian Schroer, Tobias Kipp, Michael
Publikováno v:
Materials; Volume 14; Issue 1; Pages: 228
Inhomogeneities and defects often limit the overall performance of thin-film solar cells. Therefore, sophisticated microscopy approaches are sought to characterize performance and defects at the nanoscale. Here, we demonstrate, for the first time, th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=multidiscipl::3d313c6f2af90d13786de94cc89dd6d0