Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Frank Schenkel"'
Autor:
Benjamin Prautsch, Thomas Markwirth, Frank Schenkel, Reimund Wittmann, Uwe Eichler, Jens Lienig
Publikováno v:
2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::20bc557ebadbda78c628f8d3aa20639f
https://doi.org/10.1109/smacd55068.2022.9816280
https://doi.org/10.1109/smacd55068.2022.9816280
Autor:
Michael Pronath, S. Zizala, R. Schwencker, Kurt Antreich, J. Eckmueller, Frank Schenkel, Helmut Graeb
Publikováno v:
Proceedings of the IEEE 2000 Custom Integrated Circuits Conference (Cat. No.00CH37044).
This paper presents a method to consider local process variations, which crucially influence the mismatch-sensitive analog components, within a new simulation-based analog synthesis tool called WiCkeD. WiCkeD includes tolerance analysis, performance
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6ea2d5b386322a63cbea389f2ba85c0c
https://doi.org/10.1109/cicc.2000.852720
https://doi.org/10.1109/cicc.2000.852720
Autor:
Helmut Graeb, Michael Pronath, Stephen Zizala, Frank Schenkel, Kurt Antreich, Robert Schwencker
Publikováno v:
DAC
We present a new method for mismatch analysis and automatic yield optimization of analog integrated circuits with respect to global, local and operational tolerances. Effectiveness and efficiency of yield estimation and optimization are guaranteed by
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f0d3bf7baaec3e721e822e99102fd6be
https://doi.org/10.1145/378239.379079
https://doi.org/10.1145/378239.379079
Publikováno v:
DATE
In this paper a new method for analog circuit sizing with respect to manufacturing and operating tolerances is presented. Two types of robustness objectives are presented, i.e. parameter distances for the nominal design and worst case distances for t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::27d5e3edfd8001d784dd9d6a5fb9cb80
https://doi.org/10.1145/343647.343695
https://doi.org/10.1145/343647.343695