Zobrazeno 1 - 10
of 63
pro vyhledávání: '"Frank Peiris"'
Autor:
Huiqin Zhang, Zhuoliang Ni, Christopher E. Stevens, Aofeng Bai, Frank Peiris, Joshua R. Hendrickson, Liang Wu, Deep Jariwala
Publikováno v:
Nature Photonics. 16:311-317
Optical birefringence is a fundamental optical property of crystals widely used for filtering and beam splitting of photons. Birefringent crystals concurrently possess the property of linear dichroism (LD) that allows asymmetric propagation or attenu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b3abe063d2e0a41f433a0a7dd3ba9f46
https://doi.org/10.1038/s41566-022-00970-8
https://doi.org/10.1038/s41566-022-00970-8
Publikováno v:
Thin Solid Films. 768:139731
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d0e5df40ad27aafd0f850e215b0ad0fa
https://doi.org/10.1016/j.tsf.2023.139731
https://doi.org/10.1016/j.tsf.2023.139731
Publikováno v:
Journal of Crystal Growth. 591:126714
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8e6b8b1b515a3ef5c83df41914f269db
https://doi.org/10.1016/j.jcrysgro.2022.126714
https://doi.org/10.1016/j.jcrysgro.2022.126714
Publikováno v:
Journal of Electronic Materials. 47:5715-5718
Using spectroscopic ellipsometry, the temperature-dependence of the dielectric functions of a series of Hg1−xCdxSe thin films deposited on both ZnTe/Si(112) and GaSb(112) substrates were investigated. Initially, for each sample, room-temperature el
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c55b949cb19a1d7b57a6c6d2b15f46b4
https://doi.org/10.1007/s11664-018-6222-9
https://doi.org/10.1007/s11664-018-6222-9
Publikováno v:
Journal of Crystal Growth. :126177
In-operando spectroscopic ellipsometry (SE) was used to measure the optical response of Bi2Se3 films grown on sapphire substrates in a molecular beam epitaxy (MBE) reactor during cool-down from a growth temperature of 225 °C. A temperature dependent
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1a92cc86d6b36825cd2c5cd45f1d8434
https://doi.org/10.1016/j.jcrysgro.2021.126177
https://doi.org/10.1016/j.jcrysgro.2021.126177
Autor:
Julia J. Chang, Wenyu Huang, Jeremy VanDerslice, Fabian Naab, Tiago Fiorini da Silva, Jennifer L. Hay, Oliver VandenBerg, Frank Peiris, Ludovico Cademartiri, Bin Yuan, Tian Wei Goh, Xinchun Tian
Publikováno v:
Repositório Institucional da USP (Biblioteca Digital da Produção Intelectual)
Universidade de São Paulo (USP)
instacron:USP
Universidade de São Paulo (USP)
instacron:USP
This paper describes the creation of mesoporous inorganic films based on the plasma processing of ligand-capped nanocrystals. We use nanorods of HfO2 as a model system and report an extensive chara...
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::13e5b093717c480b66cb10639b0aaec7
Publikováno v:
Advanced Materials. 28:8900-8905
The mechanical properties of colloidal nanocrystal superlattices can be tailored through exposure to low-pressure plasma. The elastic modulus and hardness of the ligand-free 3.7 nm ZrO2 superlattice are found to be similar to bulk yttria-stabilized t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b1a24d7407fe241ad2aedf7dbff83b81
https://doi.org/10.1002/adma.201601873
https://doi.org/10.1002/adma.201601873
Fabrication of semiconducting pyrite thin films from hydrothermally synthesized pyrite (FeS2) powder
Publikováno v:
Journal of Materials Science: Materials in Electronics. 27:535-542
Thin films of pyrite (FeS2) were fabricated using synthesized nano-particles and their structural, electrical and optical properties were characterized. Initially, pyrite-nano-particles were synthesized by an aqueous hydrothermal reaction. The X-ray
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7295a46f1d6220f5b91805f6a31fb3fc
https://doi.org/10.1007/s10854-015-3786-5
https://doi.org/10.1007/s10854-015-3786-5
Publikováno v:
Solid State Communications. 199:22-25
Spectroscopic ellipsometry was used to measure the dielectric functions of a series of Ga 1– x Mn x As samples from 10 K to 300 K. Initially, by modeling the ellipsometric data in the transparent region, the film thickness and the index of refracti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::42d27ee84f3fea633c3a8f02a16582da
https://doi.org/10.1016/j.ssc.2014.08.017
https://doi.org/10.1016/j.ssc.2014.08.017
Publikováno v:
Journal of Electronic Materials. 43:3056-3059
We have used infrared spectroscopic ellipsometry to interrogate the dielectric response of a series of Hg1−xCdxSe samples in a spectral range between 2000 and 40000 nm. Using a standard inversion technique, the experimental data obtained at multipl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::53f0cc82387b1d251829a504415b49fa
https://doi.org/10.1007/s11664-014-3208-0
https://doi.org/10.1007/s11664-014-3208-0