Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Frank P. Higgins"'
Publikováno v:
AT&T Technical Journal. 71:30-36
A major barrier to improved process control in electronic circuit-pack assembly is the lack of robust, high-speed, cost-effective sensing technologies. As part of an overall process-control system, AT&T's Little Rock (Arkansas) Operations Center is i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fabbafe8e0d21554013cf822f79515d9
https://doi.org/10.1002/j.1538-7305.1992.tb00171.x
https://doi.org/10.1002/j.1538-7305.1992.tb00171.x
Publikováno v:
Proceedings. International Workshop on Memory Technology, Design and Testing (Cat. No.98TB100236).
The increasing use of two parted register files (one read port and one write port) has introduced complications in complete, accurate testing. This is especially true when the memories appear as embedded cores in Systems On Chips. In this paper, we d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2bebdfc89cef4429d16f9788184571a7
https://doi.org/10.1109/mtdt.1998.705946
https://doi.org/10.1109/mtdt.1998.705946
Publikováno v:
ITC
As the density of embedded memory increases, manufacturing yields of integrated circuits can reach unacceptable limits. Normal memory testing operations require BIST to effectively deal with problems such as limited access and "at speed" testing. In
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::30d11c8691704820347763c1f04ff810
https://doi.org/10.1109/test.1998.743312
https://doi.org/10.1109/test.1998.743312
Autor:
Israel Amir, Frank P. Higgins
Publikováno v:
SPIE Proceedings.
In this paper we describe a new 3-D imaging technique using a line-scan camera. The technique is based on the intensity ratio sensing principle that was first introduced by J. Schwartz in 1983. In this technique a 2-D image of the scene is acquired t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::52bdc6123551a20c312bf9179523bcb2
https://doi.org/10.1117/12.57984
https://doi.org/10.1117/12.57984
Autor:
Frank P. Higgins, Norman R. Brunelle
Publikováno v:
AT&T Technical Journal. 65:58-65
The automation of inspection tasks has always been of prime concern to process engineers. Until recently, the technology was not available to automate anything but the simplest tasks. With advances in machine vision and computer technologies, many vi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::90278cd8f0c162e939f11d27b669886f
https://doi.org/10.1002/j.1538-7305.1986.tb00466.x
https://doi.org/10.1002/j.1538-7305.1986.tb00466.x
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