Zobrazeno 1 - 10
of 77
pro vyhledávání: '"Frank Mehnke"'
Autor:
Johannes Glaab, Neysha Lobo‑Ploch, Hyun Kyong Cho, Thomas Filler, Heiko Gundlach, Martin Guttmann, Sylvia Hagedorn, Silke B. Lohan, Frank Mehnke, Johannes Schleusener, Claudia Sicher, Luca Sulmoni, Tim Wernicke, Lucas Wittenbecher, Ulrike Woggon, Paula Zwicker, Axel Kramer, Martina C. Meinke, Michael Kneissl, Markus Weyers, Ulrike Winterwerber, Sven Einfeldt
Publikováno v:
Scientific Reports, Vol 12, Iss 1, Pp 1-3 (2022)
Externí odkaz:
https://doaj.org/article/3fd1c0f898f744d68c02bcdc6a151603
Autor:
Johannes Glaab, Neysha Lobo-Ploch, Hyun Kyong Cho, Thomas Filler, Heiko Gundlach, Martin Guttmann, Sylvia Hagedorn, Silke B. Lohan, Frank Mehnke, Johannes Schleusener, Claudia Sicher, Luca Sulmoni, Tim Wernicke, Lucas Wittenbecher, Ulrike Woggon, Paula Zwicker, Axel Kramer, Martina C. Meinke, Michael Kneissl, Markus Weyers, Ulrike Winterwerber, Sven Einfeldt
Publikováno v:
Scientific Reports, Vol 11, Iss 1, Pp 1-11 (2021)
Abstract Multiresistant pathogens such as methicillin-resistant Staphylococcus aureus (MRSA) cause serious postoperative infections. A skin tolerant far-UVC (
Externí odkaz:
https://doaj.org/article/b236578f9a8f4b3189007bc71395130c
Autor:
Ben Buse, Michael Kneissl, Tim Wernicke, Frank Mehnke, Lucia Spasevski, Daniel A. Hunter, Paul R. Edwards, Robert W. Martin, Johannes Enslin, Peter J. Parbrook, Humberto M. Foronda
Publikováno v:
Microscopy and Microanalysis. 27:696-704
Wavelength-dispersive X-ray (WDX) spectroscopy was used to measure silicon atom concentrations in the range 35–100 ppm [corresponding to (3–9) × 1018 cm−3] in doped AlxGa1–xN films using an electron probe microanalyser also equipped with a c
Autor:
Michael Kneissl, Tim Wernicke, Johannes Schleusener, Martin Guttmann, Martina C. Meinke, Ulrike Winterwerber, Lucas Wittenbecher, Paula Zwicker, Luca Sulmoni, Markus Weyers, Silke B. Lohan, Thomas Filler, Ulrike Woggon, Neysha Lobo-Ploch, Axel Kramer, Claudia Sicher, Johannes Glaab, Hyun Kyong Cho, Frank Mehnke, Sven Einfeldt, Heiko Gundlach, Sylvia Hagedorn
Publikováno v:
Scientific Reports, Vol 11, Iss 1, Pp 1-11 (2021)
Scientific Reports
Scientific Reports
Multiresistant pathogens such as methicillin-resistant Staphylococcus aureus (MRSA) cause serious postoperative infections. A skin tolerant far-UVC (2. MRSA bacteria in different concentrations on blood agar plates were inactivated with irradiation d
Autor:
Yuto Ando, Frank Mehnke, Henri Bouchard, Zhiyu Xu, Alec M. Fischer, Shyh-Chiang Shen, Fernando A. Ponce, Theeradetch Detchprohm, Russell D. Dupuis
Publikováno v:
Journal of Crystal Growth. 607:127100
Autor:
Neysha Lobo Ploch, Hyun Kyong Cho, Thomas Filler, Johannes Glaab, Heiko Gundlach, Martin Guttmann, Sylvia Hagedorn, Frank Mehnke, Jens Rass, Jan Ruschel, Marcel Schilling, Luca Sulmoni, Tim Wernicke, Lucas Wittenbecher, Ulrike Woggon, Axel Kramer, Martina C. Meinke, Michael Kneissl, Markus Weyers, Ulrike Winterwerber, Sven Einfeldt
Publikováno v:
Light-Emitting Devices, Materials, and Applications XXVI.
Autor:
Russell D. Dupuis, Frank Mehnke, Alec M. Fischer, Zhiyu Xu, Henri K. Bouchard, Theeradetch Detchprohm, Shyh-Chiang Shen, Fernando A. Ponce
Publikováno v:
Gallium Nitride Materials and Devices XVII.
Autor:
Martin Guttmann, Neysha Lobo-Ploch, Heiko Gundlach, Frank Mehnke, Luca Sulmoni, Tim Wernicke, Hyun Kyong Cho, Katrin Hilbrich, Alexander Külberg, Matthias Friedler, Thomas Filler, Indira Käpplinger, Dennis Mitrenga, Christian Maier, Olaf Brodersen, Thomas Ortlepp, Ulrike Woggon, Sven Einfeldt, Michael Kneissl
AlGaN-based far ultraviolet-C (UVC) light emitting diodes (LEDs) with a peak emission wavelength below 240 nm typically show a long-wavelength tail at >240 nm that is detrimental to the use of the devices for skin-friendly antisepsis. We present the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6ec0272800bf1193079492ae7a831e3b
https://depositonce.tu-berlin.de/handle/11303/16519
https://depositonce.tu-berlin.de/handle/11303/16519
Autor:
Lucia, Spasevski, Ben, Buse, Paul R, Edwards, Daniel A, Hunter, Johannes, Enslin, Humberto M, Foronda, Tim, Wernicke, Frank, Mehnke, Peter J, Parbrook, Michael, Kneissl, Robert W, Martin
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 27(4)
Wavelength-dispersive X-ray (WDX) spectroscopy was used to measure silicon atom concentrations in the range 35-100 ppm [corresponding to (3-9) × 1018 cm-3] in doped AlxGa1-xN films using an electron probe microanalyser also equipped with a cathodolu
Autor:
Sebastian Walde, Johannes Enslin, Tim Wernicke, Michael Kneissl, Luca Sulmoni, Hyun Kyong Cho, Norman Susilo, Martin Guttmann, Johannes Glaab, Neysha Lobo-Ploch, Giulia Cardinali, Carsten Netzel, Markus Weyers, Jan Ruschel, Marcel Schilling, Christian Kuhn, S. Hagedorn, Jens Rass, U. Winterwerber, Frank Mehnke, Sven Einfeldt
Publikováno v:
2021 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC).
Driven by a wide range of applications, as shown in Fig. 1(a) , the development of AlGaN-based light emitting diodes in the deep ultraviolet spectral range (DUV-LEDs) has greatly intensified. In contrast to conventional ultraviolet sources UV-LEDs ex