Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Frank Jezequel"'
Autor:
J. Beltritti, Philippe Galy, M. Bilinski, R. Chevallier, Sylvain Dudit, V. Varo, Frank Jezequel, C. Boutonnat, Ph. Larre, E. Petit, Michel Vallet, Jean Jimenez, Alexandre Dray
Publikováno v:
Microelectronics Reliability. 50:1388-1392
The main purpose of this paper is to present typical silicon signatures induced by charged device stress and to discuss the nature of failures. This first inventory is elaborated on advanced CMOS–BICMOS technologies until C32 nm dual oxide. It is w
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b9d27ebad3f1758ee058aebc4f1b9edb
https://doi.org/10.1016/j.microrel.2010.07.137
https://doi.org/10.1016/j.microrel.2010.07.137
Autor:
Michel Vallet, J. Beltritti, Philippe Galy, E. Petit, Sylvain Dudit, Christophe Entringer, C. Richier, Frank Jezequel
Publikováno v:
Microelectronics Reliability. 49:1107-1110
The main purpose of this article is to present some silicon signatures induced by electro-static discharge (ESD) stresses and to propose to approach it with 2D and 3D TCAD simulations and under simplifying assumptions. All test chips are stressed by
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1d223e9c70161adc1359837d89994874
https://doi.org/10.1016/j.microrel.2009.07.039
https://doi.org/10.1016/j.microrel.2009.07.039