Zobrazeno 1 - 10
of 11
pro vyhledávání: '"Francois Jacquet"'
Autor:
Philippe Bongrand, Clémence Cardon-Quint, Olivier Coutarel, François Jacquet-Francillon, Jean-Yves Langaney, Hélène Buisson-Fenet, Olivier Rey
Education is an important matter in contemporary societies, as it is highlighted by the central position of educational topics in political platforms or by the many debates about educational issues. In the meantime, one often regrets that educational
Publikováno v:
physica status solidi (a). 205:1373-1377
As the minimum dimensions of complementary metal oxide semiconductor (CMOS) transistors shrink down to 90 nm and below, some physical obstacles have been observed which prevent rigidly this miniaturization. For example, high transistor leakage curren
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1c3f120472f3293bb83712fb77ff2136
https://doi.org/10.1002/pssa.200778135
https://doi.org/10.1002/pssa.200778135
Autor:
Alexandre Villaret, Pierre Malinge, Sorin Cristoloveanu, Pascal Masson, Thomas Skotnicki, Philippe Candelier, R. Ranica, Francois Jacquet, Pascale Mazoyer
Publikováno v:
Microelectronic Engineering. 72:434-439
We report on the modeling and characterization of the memory effect observed on triple-well nMOSFETs. First, the mechanisms of charge injection, localization and retention in the floating p-well of triple-well nMOSFETs are investigated and a new mode
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e82689bc0058f447a262333f76ce86a0
https://doi.org/10.1016/j.mee.2004.01.026
https://doi.org/10.1016/j.mee.2004.01.026
Autor:
Benoit Ganne, Patrice Couvert, Renaud Ayrignac, Benoît Dupont de Dinechin, Samuel Jones, Frederic Riss, Thierry Strudel, Nicolas Morey Chaisemartin, Francois Jacquet, Pierre Guironnet de Massas, Pierre-Edouard Beaucamps
Publikováno v:
HPEC
The Kalray MPPA-256 processor integrates 256 user cores and 32 system cores on a chip with 28nm CMOS technology. Each core implements a 32-bit 5-issue VLIW architecture. These cores are distributed across 16 compute clusters of 16+1 cores, and 4 quad
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9ea33daf47010fa4906055b7dd165360
https://doi.org/10.1109/hpec.2013.6670342
https://doi.org/10.1109/hpec.2013.6670342
Autor:
Francois Jacquet-Francillon
Publikováno v:
Le Télémaque. 50:35
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1ca5dcd49b3c790de194991cd36f8603
https://doi.org/10.3917/tele.050.0035
https://doi.org/10.3917/tele.050.0035
Autor:
Francois Jacquet-Francillon
Publikováno v:
Le Télémaque. 47:39
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d2de336a7e7cbd8d2e4eca4bb53145e0
https://doi.org/10.3917/tele.047.0039
https://doi.org/10.3917/tele.047.0039
Autor:
J.P. Schoellkopf, Thomas Skotnicki, Richard Fournel, Pascale Mazoyer, R. Bouchakour, Pierre Malinge, Francois Jacquet, G. Gasiot, Pascal Masson, Alexandre Villaret, R. Ranica, P. Roche, Philippe Candelier
Publikováno v:
Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..
A one transistor DRAM cell realized on bulk substrate (lT-Bulk) with CMOS 90nm platform is presented for the first time. The device fabrication is fully compatible with logic process integration and includes only few additional steps, thus making thi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::80aa4f3132fcb2ab31d59e7b3c2f4bd7
https://doi.org/10.1109/.2005.1469203
https://doi.org/10.1109/.2005.1469203
Autor:
Philippe Candelier, R. Ranica, B. Allard, Pierre Malinge, Richard Fournel, Alexandre Villaret, Francois Jacquet, S. Martin, Pascale Mazoyer
Publikováno v:
Digest of Technical Papers. 2005 Symposium on VLSI Circuits, 2005..
An 8 Mbit memory chip featuring a floating body one transistor cell on bulk substrate is characterized for the first time. A high-speed and high accuracy current sense-amplifier with a large common mode reference current is proposed. It achieves a re
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1f564afd95955ad5f1fc52e97da00cd8
https://doi.org/10.1109/vlsic.2005.1469404
https://doi.org/10.1109/vlsic.2005.1469404
Publikováno v:
2004 IEEE International Reliability Physics Symposium. Proceedings.
Terrestrial radiations, such as neutrons or alpha, create charges which, when collected by sensitive memory nodes, can destroy its stored information. Such a failure is called a soft error since only the data is destroyed while the circuit itself is
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::439d69dc28e63fcf51a317e024fef0e2
https://doi.org/10.1109/relphy.2004.1315444
https://doi.org/10.1109/relphy.2004.1315444