Zobrazeno 1 - 10
of 16
pro vyhledávání: '"Franck, BayLe"'
Autor:
Franck Bayle
Every parent is concerned when a child is slow to become a mature adult. This is also true for any product designer, regardless of their industry sector. For a product to be mature, it must have an expected level of reliability from the moment it is
Autor:
Franck Bayle
Every parent is concerned when a child is slow to become a mature adult. This is also true for any product designer, regardless of their industry sector. For a product to be mature, it must have an expected level of reliability from the moment it is
Autor:
Aurelien Janvresse, Romain Guetard, Antonin Pastre, Suzel Lavagne, Pierre Lebosse, Julien Coutet, Michel Sarlotte, E. Doche, Franck Bayle, C. Moreau, François Marc
Publikováno v:
Microelectronics Reliability
Microelectronics Reliability, Elsevier, 2019, 100-101, pp.113442. ⟨10.1016/j.microrel.2019.113442⟩
Microelectronics Reliability, 2019, 100-101, pp.113442. ⟨10.1016/j.microrel.2019.113442⟩
Microelectronics Reliability, Elsevier, 2019, 100-101, pp.113442. ⟨10.1016/j.microrel.2019.113442⟩
Microelectronics Reliability, 2019, 100-101, pp.113442. ⟨10.1016/j.microrel.2019.113442⟩
This paper deals with data analysis of long term (2 years) accelerated stress test of a 65 nm ASIC dedicated to cryptographic applications. Several stress conditions have been applied by combining both thermal and electrical overvoltage stresses. At
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7547ea900b412035b7f97d7f96af3eca
https://hal.archives-ouvertes.fr/hal-02394907
https://hal.archives-ouvertes.fr/hal-02394907
Autor:
Franck Bayle
Today, the reliability of systems has become a major issue in most industrial applications. The theoretical approach to estimating reliability was largely developed in the 1960s for maintenance-free systems, and more recently, in the late 1990s, it w
Autor:
Carine Bredin, Christian Tabart, Daddio Salvatore, Thibaut Decoopman, Tito Lupi, Franck Bayle, Alfredo Catalani, Asma Kallel, Jean-Claude Orlhac, Christophe Malassingne, Pierre-Olivier Antoine
Publikováno v:
2018 IEEE 15th Specialist Meeting on Microwave Radiometry and Remote Sensing of the Environment (MicroRad).
This paper describes the MWI radiometer being developed for MetOp-SG. It provides an overview of the mission, the instrument concept and the key technologies used in the RF assembly. The predicted radiometric and geometric performances are also prese
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::86ee9f31941ecce9a19c871ce53ff9f4
https://doi.org/10.1109/microrad.2018.8430722
https://doi.org/10.1109/microrad.2018.8430722
Autor:
Franck Bayle, Dan Borza, Pierre Richard Dahoo, Philippe Descamps, Pascal Dherbecourt, Abdelkhalak El Hami, Philippe Eudeline, Maxime Fontaine, Christian Gautier, Eric Joubert, Moncef Kadi, Alain Kamdel, Samh Khemiri, Malika Khettab, Ludovic Lacheze, Olivier Latry, Jorge Linares, Hichame Maanane, Patrick Martin, Ioana Nistea, Hubert Polaert, Philippe Pougnet, Bouchaïb Radi, Abhishek Ramanujan, Zouheir Riah
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a2a79edfb444707fecdd52fa022dcd3a
https://doi.org/10.1016/b978-1-78548-260-1.50018-2
https://doi.org/10.1016/b978-1-78548-260-1.50018-2