Zobrazeno 1 - 10
of 90
pro vyhledávání: '"Francis Calmon"'
Autor:
Shaochen Gao, Duc-Tung Vu, Thibauld Cazimajou, Patrick Pittet, Martine Le Berre, Mohammadreza Dolatpoor Lakeh, Fabien Mandorlo, Régis Orobtchouk, Jean-Baptiste Schell, Jean-Baptiste Kammerer, Andreia Cathelin, Dominique Golanski, Wilfried Uhring, Francis Calmon
Publikováno v:
Photonics, Vol 11, Iss 6, p 526 (2024)
The integration of Single-Photon Avalanche Diodes (SPADs) in CMOS Fully Depleted Silicon-On-Insulator (FD-SOI) technology under a buried oxide (BOX) layer and a silicon film containing transistors makes it possible to realize a 3D SPAD at the chip le
Externí odkaz:
https://doaj.org/article/ac80468040404a60aef0d5871a92f1c9
Autor:
Mohammadreza Dolatpoor Lakeh, Jean-Baptiste Kammerer, Enagnon Aguénounon, Dylan Issartel, Jean-Baptiste Schell, Sven Rink, Andreia Cathelin, Francis Calmon, Wilfried Uhring
Publikováno v:
Sensors, Vol 21, Iss 12, p 4014 (2021)
An ultrafast Active Quenching—Active Reset (AQAR) circuit is presented for the afterpulsing reduction in a Single Photon Avalanche Diode (SPAD). The proposed circuit is designed in a 28 nm Fully Depleted Silicon On Insulator (FD-SOI) CMOS technolog
Externí odkaz:
https://doaj.org/article/aaf158516ac04e7c8768e5982d5e8ccf
Publikováno v:
International Journal of Antennas and Propagation, Vol 2017 (2017)
A novel high-efficiency compact planar antenna at 433 MHz with minimized size and low-cost and easy to integrate into the ISM wireless applications is designed, fabricated, and measured. Capacitive strips that are formed by cutting inter-digital slot
Externí odkaz:
https://doaj.org/article/7c88822f075b456da0a86fbe639d5bb4
Publikováno v:
2023 IEEE Wireless Communications and Networking Conference (WCNC).
Autor:
Yue Ma, Samir Labiod, Latifa Fakri-Bouchet, Jacques Verdier, Francis Calmon, Saïda Latreche, Christian Gontrand
Publikováno v:
International Journal of Mathematics and Statistics. 4
In recent years, NMR/MRI portable devices have drawn attention of numerous researcher teams. They are used for variety of applications, from medical diagnosis to archaeological analysis, nondestructive material testing evaluation of water presence in
Publikováno v:
2022 IEEE International Integrated Reliability Workshop (IIRW)
2022 IEEE International Integrated Reliability Workshop (IIRW), Oct 2022, South Lake Tahoe, United States. pp.1-5, ⟨10.1109/IIRW56459.2022.10032759⟩
2022 IEEE International Integrated Reliability Workshop (IIRW), Oct 2022, South Lake Tahoe, United States. pp.1-5, ⟨10.1109/IIRW56459.2022.10032759⟩
International audience
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3c7ead0faf34128b95bf049b53874186
https://hal.science/hal-04138806
https://hal.science/hal-04138806
Autor:
R. Orobtchouk, Dominique Golanski, D. Issartel, Andreia Cathelin, S. Gao, Francis Calmon, F. Mandorlo
Publikováno v:
2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Sep 2021, Dallas, United States. pp.301-304, ⟨10.1109/SISPAD54002.2021.9592555⟩
2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Sep 2021, Dallas, United States. pp.301-304, ⟨10.1109/SISPAD54002.2021.9592555⟩
International audience; In this article, a 3D electro-optical simulation method is presented in order to estimate the Photon Detection Probability (PDP) of Single-Photon Avalanche Diodes (SPAD). The efficiency of the proposed simulation flow is demon
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::85ba6b29c2a8d1d7f64fd43412a2b753
https://halshs.archives-ouvertes.fr/halshs-03515486
https://halshs.archives-ouvertes.fr/halshs-03515486
Autor:
Christel Buj, Jean Coignus, Mathieu Sicre, Bastien Mamdy, Megan Agnew, Isobel Nicholson, Francis Calmon, Dominique Golanski, Sara Pellegrini, Remi Helleboid, Denis Rideau, David Roy
Publikováno v:
ESSCIRC / ESSDERC 2021-IEEE 47th European Solid State Circuits Conference
ESSCIRC / ESSDERC 2021-IEEE 47th European Solid State Circuits Conference, Sep 2021, Grenoble, France. pp.143-146, ⟨10.1109/ESSCIRC53450.2021.9567806⟩
ESSCIRC
ESSCIRC / ESSDERC 2021-IEEE 47th European Solid State Circuits Conference, Sep 2021, Grenoble, France. pp.143-146, ⟨10.1109/ESSCIRC53450.2021.9567806⟩
ESSCIRC
International audience; Dark Count Rate (DCR) in Single-Photon Avalanche Diodes (SPAD) in Complementary Metal-Oxide Semiconductor technology is characterized and analyzed with a comprehensive simulation methodology. Based on a series of measurements
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b208fa65be46deaffeb0334ada8c6e46
https://hal.science/hal-03622065
https://hal.science/hal-03622065
Autor:
Remy Cellier, Francis Calmon, Dominique Golanski, Patrick Pittet, Andreia Cathelin, Scott C. Hagen, D. Issartel, S. Gao
Publikováno v:
2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS).
This article presents a study of Single Photon Avalanche Diodes (SPAD) implemented in 28nm Fully Depleted Silicon-On-Insulator (FD-SOI) CMOS technology based on transient TCAD simulations. The integration of SPAD in this technology is currently being
Autor:
Dominique Golanski, Francis Calmon, Andreia Cathelin, D. Issartel, S. Gao, F. Mandorlo, R. Orobtchouk
Publikováno v:
2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS).
This article proposes a 3D electro-optical simulation method to estimate the Photon Detection Probability (PDP) of Single-Photon Avalanche Diodes (SPAD) implemented in 28nm Fully Depleted Silicon-On-Insulator (FD-SOI) CMOS technology. In order to imp