Zobrazeno 1 - 10
of 18
pro vyhledávání: '"Francesco Torretti"'
Autor:
Ruben Schupp, Randy Meijer, Oscar Versolato, Ronnie Hoekstra, Stefan Witte, John Sheil, Amanda Neukirch, M. M. Basko, Francesco Torretti, James Colgan, Muharrem Bayraktar, Wim Ubachs
Publikováno v:
Nature Communications, Vol 11, Iss 1, Pp 1-8 (2020)
Nature Communications, 11(1):2334, 1-8. Nature Publishing Group
Torretti, F, Sheil, J, Schupp, R, Basko, M M, Bayraktar, M, Meijer, R A, Witte, S, Ubachs, W, Hoekstra, R, Versolato, O O, Neukirch, A J & Colgan, J 2020, ' Prominent radiative contributions from multiply-excited states in laser-produced tin plasma for nanolithography ', Nature Communications, vol. 11, no. 1, 2334, pp. 1-8 . https://doi.org/10.1038/s41467-020-15678-y
Nature Communications
Nature Communications, 11(1):2334. Nature Publishing Group
Nature communications, 11(1):2334. Nature Publishing Group
Nature Communications, 11(1):2334, 1-8. Nature Publishing Group
Torretti, F, Sheil, J, Schupp, R, Basko, M M, Bayraktar, M, Meijer, R A, Witte, S, Ubachs, W, Hoekstra, R, Versolato, O O, Neukirch, A J & Colgan, J 2020, ' Prominent radiative contributions from multiply-excited states in laser-produced tin plasma for nanolithography ', Nature Communications, vol. 11, no. 1, 2334, pp. 1-8 . https://doi.org/10.1038/s41467-020-15678-y
Nature Communications
Nature Communications, 11(1):2334. Nature Publishing Group
Nature communications, 11(1):2334. Nature Publishing Group
Extreme ultraviolet (EUV) lithography is currently entering high-volume manufacturing to enable the continued miniaturization of semiconductor devices. The required EUV light, at 13.5 nm wavelength, is produced in a hot and dense laser-driven tin pla
Autor:
D. A. Czapski, Oscar Versolato, John Sheil, H. Bekker, Francesco Torretti, A. N. Ryabtsev, Ronnie Hoekstra, Chintan Shah, J. R. Crespo López-Urrutia, Joris Scheers, Julian C. Berengut, Wim Ubachs
Publikováno v:
Physical Review A
Extreme-ultraviolet (EUV) spectra of ${\mathrm{Sn}}^{13+}\ensuremath{-}{\mathrm{Sn}}^{15+}$ ions have been measured in an electron-beam ion trap (EBIT). A matrix inversion method is employed to unravel convoluted spectra from a mixture of charge stat
Autor:
Zoi Bouza, Francesco Torretti, Alex Bayerle, M. J. Deuzeman, J. R. Crespo López-Urrutia, John Sheil, Ronnie Hoekstra, S. Rai, Randy Meijer, James Colgan, Muharrem Bayraktar, R. Schupp, Wim Ubachs, Amanda Neukirch, Dmitry Kurilovich, Stefan Witte, Bo Liu, A N Ryabtsev, Lucas Poirier, Oscar Versolato, Joris Scheers, Lars Behnke, H. Bekker
Publikováno v:
Journal of Physics : Conference Series, 1412(19):192006, 1-1. IOP Publishing Ltd.
Versolato, O, Bayerle, A, Bayraktar, M, Behnke, L, Bekker, H, Bouza, Z, Colgan, J, Crespo López-Urrutia, J R, Deuzeman, M J, Hoekstra, R, Kurilovich, D, Liu, B, Meijer, R, Neukirch, A, Poirier, L, Rai, S, Ryabtsev, A, Scheers, J, Schupp, R, Sheil, J, Torretti, F, Ubachs, W & Witte, S 2020, ' Spectroscopic investigations of YAG-laser-driven microdroplet-tin plasma sources of extreme ultraviolet radiation for nanolithography ', Journal of Physics : Conference Series, vol. 1412, no. 19, 192006, pp. 1-1 . https://doi.org/10.1088/1742-6596/1412/19/192006
Journal of Physics: Conference Series: Plasmas & Particle acceleration, 1412(19)
ISSUE=31;TITLE=XXXIst International Conference on Photonic, Electronic, and Atomic Collisions 2019
Versolato, O, Bayerle, A, Bayraktar, M, Behnke, L, Bekker, H, Bouza, Z, Colgan, J, Crespo López-Urrutia, J R, Deuzeman, M J, Hoekstra, R, Kurilovich, D, Liu, B, Meijer, R, Neukirch, A, Poirier, L, Rai, S, Ryabtsev, A, Scheers, J, Schupp, R, Sheil, J, Torretti, F, Ubachs, W & Witte, S 2020, ' Spectroscopic investigations of YAG-laser-driven microdroplet-tin plasma sources of extreme ultraviolet radiation for nanolithography ', Journal of Physics : Conference Series, vol. 1412, no. 19, 192006, pp. 1-1 . https://doi.org/10.1088/1742-6596/1412/19/192006
Journal of Physics: Conference Series: Plasmas & Particle acceleration, 1412(19)
ISSUE=31;TITLE=XXXIst International Conference on Photonic, Electronic, and Atomic Collisions 2019
Synopsis Highly charged tin ions are the sources of extreme ultraviolet (EUV) light at 13.5-nm wavelength in laser-produced transient plasmas for next-generation nanolithography. Generating this EUV light at the required power, reliability, and stabi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5e956001d45df07270d8fa3564c9b180
https://research.vu.nl/en/publications/8f9f2979-35c0-4135-bd86-9053be94e3e3
https://research.vu.nl/en/publications/8f9f2979-35c0-4135-bd86-9053be94e3e3
Autor:
Zoi Bouza, Muharrem Bayraktar, Francesco Torretti, Wim Ubachs, Oscar Versolato, Fei Liu, Ronnie Hoekstra, Joris Scheers
Publikováno v:
Torretti, F, Liu, F, Bayraktar, M, Scheers, J, Bouza, Z, Ubachs, W, Hoekstra, R & Versolato, O 2020, ' Spectral characterization of an industrial EUV light source for nanolithography ', Journal of Physics D. Applied Physics, vol. 53, no. 5, 055204, pp. 1-7 . https://doi.org/10.1088/1361-6463/ab56d4
Journal of Physics D. Applied Physics, 53(5):055204, 1-7. IOP Publishing Ltd.
Journal of Physics D-Applied Physics, 53(5):055204. IOP PUBLISHING LTD
Journal of Physics D: Applied Physics
Journal of physics D: applied physics, 53(5):055204. Institute of Physics (IOP)
Journal of Physics D. Applied Physics, 53(5):055204, 1-7. IOP Publishing Ltd.
Journal of Physics D-Applied Physics, 53(5):055204. IOP PUBLISHING LTD
Journal of Physics D: Applied Physics
Journal of physics D: applied physics, 53(5):055204. Institute of Physics (IOP)
The emission spectra from an industrial, droplet-based, laser-produced plasma, extreme ultraviolet light source for nanolithography are here presented and analyzed. The dependence of spectral features on the CO2-drive-laser intensity is studied by ch
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::93d55d50cdc3188100bb6f70bb848dc5
https://research.vu.nl/en/publications/be2831dd-ec8c-4bd1-8fa7-7231c758d379
https://research.vu.nl/en/publications/be2831dd-ec8c-4bd1-8fa7-7231c758d379
Autor:
Oscar Versolato, Stefan Witte, Kjeld S. E. Eikema, Francesco Torretti, Ruben Schupp, John Sheil, Muharrem Bayraktar, Joris Scheers, Dmitry Kurilovich, Ronnie Hoekstra, Wim Ubachs, Alexander Schafgans, Randy Meijer, Alex Bayerle, Michael Purvis
Publikováno v:
Applied Physics Letters, 115(12):124101, 1-5. American Institute of Physics Publising LLC
Applied Physics Letters, 115(12):124101. AMER INST PHYSICS
Applied Physics Letters
Schupp, R, Torretti, F, Meijer, R A, Bayraktar, M, Sheil, J, Scheers, J, Kurilovich, D, Bayerle, A, Schafgans, A A, Purvis, M, Eikema, K S E, Witte, S, Ubachs, W, Hoekstra, R & Versolato, O O 2019, ' Radiation transport and scaling of optical depth in Nd:YAG laser-produced microdroplet-tin plasma ', Applied Physics Letters, vol. 115, no. 12, 124101, pp. 1-5 . https://doi.org/10.1063/1.5117504
Applied physics letters, 115(12):124101. American Institute of Physics
Applied Physics Letters, 115(12):124101. AMER INST PHYSICS
Applied Physics Letters
Schupp, R, Torretti, F, Meijer, R A, Bayraktar, M, Sheil, J, Scheers, J, Kurilovich, D, Bayerle, A, Schafgans, A A, Purvis, M, Eikema, K S E, Witte, S, Ubachs, W, Hoekstra, R & Versolato, O O 2019, ' Radiation transport and scaling of optical depth in Nd:YAG laser-produced microdroplet-tin plasma ', Applied Physics Letters, vol. 115, no. 12, 124101, pp. 1-5 . https://doi.org/10.1063/1.5117504
Applied physics letters, 115(12):124101. American Institute of Physics
Experimental scaling relations of the optical depth are presented for the emission spectra of a tin-droplet-based, 1-μm-laser-produced plasma source of extreme-ultraviolet (EUV) light. The observed changes in the complex spectral emission of the pla
Autor:
Stefan Witte, Muharrem Bayraktar, Kjeld S. E. Eikema, Francesco Torretti, Randy Meijer, Oscar Versolato, Ronnie Hoekstra, Ruben Schupp, Joris Scheers, Alex Bayerle, Wim Ubachs, Dmitry Kurilovich
Publikováno v:
Physical Review Applied, 12(1):014010, 1-11. American Physical Society
Physical Review Applied, 12(1):014010. AMER PHYSICAL SOC
Schupp, R, Torretti, F, Meijer, R A, Bayraktar, M, Scheers, J, Kurilovich, D, Bayerle, A, Eikema, K S E, Witte, S, Ubachs, W, Hoekstra, R & Versolato, O O 2019, ' Efficient Generation of Extreme Ultraviolet Light from Nd:YAG-Driven Microdroplet-Tin Plasma ', Physical Review Applied, vol. 12, no. 1, 014010, pp. 1-11 . https://doi.org/10.1103/PhysRevApplied.12.014010
Physical review applied, 12(1):014010. American Physical Society
Physical Review Applied, 12(1):014010. AMER PHYSICAL SOC
Schupp, R, Torretti, F, Meijer, R A, Bayraktar, M, Scheers, J, Kurilovich, D, Bayerle, A, Eikema, K S E, Witte, S, Ubachs, W, Hoekstra, R & Versolato, O O 2019, ' Efficient Generation of Extreme Ultraviolet Light from Nd:YAG-Driven Microdroplet-Tin Plasma ', Physical Review Applied, vol. 12, no. 1, 014010, pp. 1-11 . https://doi.org/10.1103/PhysRevApplied.12.014010
Physical review applied, 12(1):014010. American Physical Society
We experimentally investigate the emission of EUV light from a mass-limited laser-produced plasma over a wide parameter range by varying the diameter of the targeted tin microdroplets and the pulse duration and energy of the 1-mu m-wavelength Nd:YAG
Autor:
Hanneke Gelderblom, Aneta Stodolna, Kjeld S. E. Eikema, Francesco Torretti, Tiago de Faria Pinto, Stefan Witte, Wim Ubachs, Joris Scheers, Ronnie Hoekstra, Oscar Versolato, Ruben Schupp, Dmitry Kurilovich
Publikováno v:
Kurilovich, D, Pinto, T D F, Torretti, F, Schupp, R, Scheers, J, Stodolna, A S, Gelderblom, H, Eikema, K S E, Witte, S, Ubachs, W, Hoekstra, R & Versolato, O O 2018, ' Expansion Dynamics after Laser-Induced Cavitation in Liquid Tin Microdroplets ', Physical Review Applied, vol. 10, no. 5, 054005, pp. 1-8 . https://doi.org/10.1103/PhysRevApplied.10.054005
Physical Review Applied, 10(5):054005. American Physical Society
Physical Review Applied, 10(5):054005. AMER PHYSICAL SOC
Physical Review Applied, 10(5):054005, 1-8. American Physical Society
Physical Review Applied, 10(5):054005. American Physical Society
Physical Review Applied, 10(5):054005. AMER PHYSICAL SOC
Physical Review Applied, 10(5):054005, 1-8. American Physical Society
The cavitation-driven expansion dynamics of liquid tin microdroplets is investigated, set in motion by the ablative impact of a 15-ps laser pulse. We combine high-resolution stroboscopic shadowgraphy with an intuitive fluid dynamic model that include
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d44d154cdfda894738ae98ecbc814da9
https://hdl.handle.net/1871.1/746d4d6f-3474-441a-a0cc-d295a3e1e423
https://hdl.handle.net/1871.1/746d4d6f-3474-441a-a0cc-d295a3e1e423
Publikováno v:
Reijers, S A, Kurilovich, D, Torretti, F, Gelderblom, H & Versolato, O O 2018, ' Laser-to-droplet alignment sensitivity relevant for laser-produced plasma sources of extreme ultraviolet light ', Journal of Applied Physics, vol. 124, no. 1, 013102 . https://doi.org/10.1063/1.5026950
Journal of Applied Physics, 124(1):013102. American Institute of Physics
Journal of Applied Physics, 124(1):013102. American Institute of Physics Publising LLC
Journal of Applied Physics, 124(1):013102. American Institute of Physics
Journal of Applied Physics, 124(1):013102. American Institute of Physics Publising LLC
We present and experimentally validate a model describing the sensitivity of the tilt angle, expansion and propulsion velocity of a tin micro-droplet irradiated by a 1 {\mu}m Nd:YAG laser pulse to its relative alignment. This sensitivity is particula
Autor:
Anastasia Borschevsky, Ronnie Hoekstra, Wim Ubachs, Ruben Schupp, Dmitry Kurilovich, K. Haris, A. N. Ryabtsev, Joris Scheers, Oscar Versolato, Alex Bayerle, Julian C. Berengut, Ephraim Eliav, Francesco Torretti
Publikováno v:
Scheers, J, Ryabtsev, A, Borschevsky, A, Berengut, J C, Haris, K, Schupp, R, Kurilovich, D, Torretti, F, Bayerle, A, Eliav, E, Ubachs, W, Versolato, O O & Hoekstra, R 2018, ' Energy-level structure of Sn3+ ions ', Physical Review A, vol. 98, no. 6, 062503, pp. 1-12 . https://doi.org/10.1103/PhysRevA.98.062503
Physical Review A, 98(6):062503. AMER PHYSICAL SOC
Physical Review A, 98(6):062503, 1-12. American Physical Society
Physical Review A, 98(6):062503. AMER PHYSICAL SOC
Physical Review A, 98(6):062503, 1-12. American Physical Society
Laser-produced Sn plasma sources are used to generate extreme ultraviolet (EUV) light in state-of-the-art nanolithography. An ultraviolet and optical spectrum is measured from a droplet-based laser-produced Sn plasma, with a spectrograph covering the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9a487e5c86a011d1d1e0f8d8a671f8fa
http://arxiv.org/abs/1807.01644
http://arxiv.org/abs/1807.01644
Autor:
Tiago de Faria Pinto, Stefan Witte, Wim Ubachs, Dmitry Kurilovich, Joris Scheers, Ruben Schupp, Francesco Torretti, Ronnie Hoekstra, Kjeld S. E. Eikema, Oscar Versolato, Aneta Stodolna
Publikováno v:
Optics InfoBase Conference Papers
Kurilovich, D, Pinto, T, Schupp, R, Torretti, F, Scheers, J, Stodolna, A, Eikema, K S, Witte, S, Ubachs, W, Hoekstra, R & Versolato, O O 2018, Cavitation-induced expansion dynamics of tin microdroplet target in EUV light sources . in Compact EUV and X-ray Light Sources 2018 : Proceedings High-Brightness Sources and Light-driven Interactions Part of High-brightness Sources and Light-driven Interactions ., JT4A.2, OSA-The Optical Society, Compact EUV and X-ray Light Sources, EUVXRAY 2018, Strasbourg, France, 26/03/17 . https://doi.org/10.1364/EUVXRAY.2018.JT4A.2
Compact EUV and X-ray Light Sources 2018: Proceedings High-Brightness Sources and Light-driven Interactions Part of High-brightness Sources and Light-driven Interactions
Compact EUV and X-ray Light Sources 2018
Kurilovich, D, Pinto, T, Schupp, R, Torretti, F, Scheers, J, Stodolna, A, Eikema, K S, Witte, S, Ubachs, W, Hoekstra, R & Versolato, O O 2018, Cavitation-induced expansion dynamics of tin microdroplet target in EUV light sources . in Compact EUV and X-ray Light Sources 2018 : Proceedings High-Brightness Sources and Light-driven Interactions Part of High-brightness Sources and Light-driven Interactions ., JT4A.2, OSA-The Optical Society, Compact EUV and X-ray Light Sources, EUVXRAY 2018, Strasbourg, France, 26/03/17 . https://doi.org/10.1364/EUVXRAY.2018.JT4A.2
Compact EUV and X-ray Light Sources 2018: Proceedings High-Brightness Sources and Light-driven Interactions Part of High-brightness Sources and Light-driven Interactions
Compact EUV and X-ray Light Sources 2018
Laser-induced cavitation in tin microdroplets can be used to obtain optimized laser targets in EUV sources for nanolithography. We present our experimental analysis of microdroplet expansion and find good agreement with a fluid dynamics model.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7318a5b01fa0cbb797b97c38f0b15686
https://research.vu.nl/en/publications/8bff4759-fa6b-464e-b54e-5dd116fb58cb
https://research.vu.nl/en/publications/8bff4759-fa6b-464e-b54e-5dd116fb58cb