Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Francesco Pascarella"'
Autor:
Amedeo Buonanno, Giampaolo Caputo, Irena Balog, Salvatore Fabozzi, Giovanna Adinolfi, Francesco Pascarella, Gianni Leanza, Giorgio Graditi, Maria Valenti
Publikováno v:
Energies, Vol 17, Iss 9, p 2203 (2024)
Accurate predictions of photovoltaic generation are essential for effectively managing power system resources, particularly in the face of high variability in solar radiation. This is especially crucial in microgrids and grids, where the proper opera
Externí odkaz:
https://doaj.org/article/69772592004a4155bc2330557aedc7c1
Autor:
Mauro Atrigna, Maria Valenti, Giovanna Adinolfi, Francesco Pascarella, Giorgio Graditi, Amedeo Buonanno, Angelo Merola, Roberto Ciavarella, Antonio Ricca, Gianluca Sforza
Publikováno v:
2021 IEEE International Conference on Environment and Electrical Engineering and 2021 IEEE Industrial and Commercial Power Systems Europe (EEEIC / I&CPS Europe).
Interest in microgrids is advancing as they contribute to local energy management while preserving the main grid operation. However, their introduction poses problems of reliability, particularly when renewable sources are present. Therefore, devices
Autor:
C. Cancro, Aniello Borriello, Sergio Ferlito, R. Fucci, Gianni Leanza, Gabriele Ciniglio, Angelo Merola, Giorgio Graditi, Francesco Pascarella
Publikováno v:
AIP Conference Proceedings.
This paper reports the results of a performance analysis carried out by ENEA on a CPV system, produced by BECAR srl within a European collaborative Project named ECOSOLE, and installed at ENEA Research Center of Portici. Modules degradation after two
Autor:
G. Di Francia, Dario Della Sala, G. Sinno, Francesco Roca, A. Citarella, P. Grillo, P. Prosini, G. Fameli, Francesco Pascarella
Publikováno v:
Solar Energy Materials and Solar Cells. 48:15-24
We have already investigated some crucial limiting process steps of the amorphous silicon (a-Si)/crystalline silicon (c-Si) solar cell technology and some specific characterization tools of the ultrathin amorphous material used in devices. In this wo
Publikováno v:
Journal of Applied Physics. 78:7269-7276
Infrared multiple internal reflection (MIR) spectroscopy has been applied here to the characterization (ex situ) of thin amorphous silicon layers on crystalline silicon substrates. The specimens are tightly clamped against a Ge prism with 45° bevel