Zobrazeno 1 - 1
of 1
pro vyhledávání: '"François J. Laruelle"'
Autor:
V. Hortelano, Juan Fernando Masa Jiménez, J. Périnet, Jorge Souto, François J. Laruelle, Julian Anaya
Publikováno v:
Microelectronics Reliability. 53:1501-1505
Degradation of high power laser diodes is related to defect formation in the active parts of the laser. Extended defects can develop both at the facets, and inside the cavity. Their characterization is necessary for understanding the mechanisms drivi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1c7cd0fd4f943cd2f453d5a5d7337148
https://doi.org/10.1016/j.microrel.2013.07.071
https://doi.org/10.1016/j.microrel.2013.07.071
