Zobrazeno 1 - 10
of 25
pro vyhledávání: '"François Blateyron"'
Publikováno v:
Metrology, Vol 4, Iss 2, Pp 141-163 (2024)
Stitching methods allow one to measure a wider surface without the loss of resolution. The observation of small details with a better topographical representation is thus possible. However, it is not excluded that stitching methods generate some erro
Externí odkaz:
https://doaj.org/article/c3c8efd0253941a29a710dcb39a639db
Autor:
Julie Lemesle, Clement Moreau, Raphael Deltombe, Joseph Martin, François Blateyron, Maxence Bigerelle, Christopher A. Brown
Publikováno v:
Materials, Vol 16, Iss 15, p 5408 (2023)
Topographic maps are composed of pixels associated with coordinates (x, y, z) on a surface. Each pixel location (x, y) is linked with fluctuations in a measured height sample (z). Fluctuations here are uncertainties in heights estimated from multiple
Externí odkaz:
https://doaj.org/article/876863d183aa42279f465dd828555cc5
Autor:
Julie Lemesle, Clement Moreau, Raphael Deltombe, François Blateyron, Joseph Martin, Maxence Bigerelle, Christopher A. Brown
Publikováno v:
Materials, Vol 16, Iss 2, p 473 (2023)
A top-down method is presented and studied for quantifying topographic map height (z) fluctuations directly from measurements on surfaces of interest. Contrary to bottom-up methods used in dimensional metrology, this method does not require knowledge
Externí odkaz:
https://doaj.org/article/87fe08e2494d45db94e9540bd7e241ba
Autor:
Ivan Calandra, Konstantin Bob, Gildas Merceron, François Blateyron, Andreas Hildebrandt, Ellen Schulz-Kornas, Antoine Souron, Daniela E. Winkler
Publikováno v:
Peer Community Journal. 2
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a661154278a6e20b0cd6a37a67f6f347
https://doi.org/10.24072/pcjournal.204
https://doi.org/10.24072/pcjournal.204
Publikováno v:
CIRP Annals
This keynote paper gives an overview of emerging technologies of feature-based characterisation, for surface topographies having features. It is complementary to conventional surface characterisation using texture field parameters. An original concep
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8de96f951987eaf20b26b8a852901d3d
Autor:
François Blateyron, Nicola Senin
Publikováno v:
Precision Metal Additive Manufacturing ISBN: 9780429436543
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bd40468fce557c3ed8e79f2598d82bd1
https://hdl.handle.net/11391/1553417
https://hdl.handle.net/11391/1553417
Autor:
François Blateyron
Publikováno v:
CIRP Encyclopedia of Production Engineering ISBN: 9783642359507
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d94e669dfe55b4cb644552316b2b72df
https://doi.org/10.1007/978-3-662-53120-4_16857
https://doi.org/10.1007/978-3-662-53120-4_16857
Autor:
François Blateyron, Bertrand Leroy
Publikováno v:
Surface Topography: Metrology and Properties. 9:015001
Segmentation of profile features is mainly described in two standards: ISO 4287 for profile elements, used to calculate RSm and Rc, and ISO 12085 for profile motifs, used to calculate R&W parameters. These methods are commonly criticised for their un
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::509c9c5b9610e0934364e59b5f3b36fa
https://doi.org/10.1088/2051-672x/abce0f
https://doi.org/10.1088/2051-672x/abce0f