Zobrazeno 1 - 10
of 201
pro vyhledávání: '"Frédéric Wrobel"'
Autor:
Cleiton Marques, Frédéric Wrobel, Ygor Aguiar, Alain Michez, Jérôme Boch, Frédéric Saigné, Rubén García Alía
Publikováno v:
Eng, Vol 5, Iss 1, Pp 319-332 (2024)
This work explains that the Coulomb elastic process on the nucleus is a major source of single-event effects (SEE) for protons within the energy range of 1–10 MeV. The infinite range of Coulomb interactions implies an exceptionally high recoil prob
Externí odkaz:
https://doaj.org/article/99e190c42e154829b9df7c25baca9575
Autor:
Hugo Cintas, Frédéric Wrobel, Marine Ruffenach, Damien Herrera, Frédéric Saigné, Athina Varotsou, Françoise Bezerra, Julien Mekki
Publikováno v:
Aerospace, Vol 10, Iss 3, p 295 (2023)
The device downscaling of electronic components has given rise to the need to consider specific failures in onboard airplane electronics. Single Event Effects (SEE) are a kind of failures that occur due to radiation in the atmosphere. For the purpose
Externí odkaz:
https://doaj.org/article/02f0179eb21f466cbd918c47b24d00bd
Autor:
François Ginisty, Frédéric Wrobel, Robert Ecoffet, Nicolas Balcon, Julien Mekki, Marine Ruffenach, Denis Standarovski, Alain Michez
Publikováno v:
Advances in Space Research. 71:4401-4409
Autor:
François Ginisty, Frédéric Wrobel, Robert Ecoffet, Mioara Mandea, Alain Michez, Nicolas Balcon, Marine Ruffenach, Julien Mekki
The SEM-2 (Space Environment Monitor-2) instrument embedded on the NOAA-15 Low Earth Orbit satellite provides measurements of trapped protons in the Van Allen inner belt from 1998 to nowadays. This continuous amount of measurements enables us to stud
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1024658eabd4bbff6bc52445613e839c
https://doi.org/10.5194/egusphere-egu23-12704
https://doi.org/10.5194/egusphere-egu23-12704
Autor:
Frédéric Wrobel, Ygor Aguiar, Cleiton Marques, Giuseppe Lerner, Rubén García Alía, Frédéric Saigné, Jérôme Boch
Publikováno v:
Electronics; Volume 12; Issue 1; Pages: 104
In the atmosphere, it is generally understood that neutrons are the main contributor to the soft error rate (SER) in electronic devices. These particles are indeed able to trigger nuclear reactions in the sensitive regions of the devices, leading to
Autor:
Ygor Q. Aguiar, Frédéric Wrobel, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Vincent Pouget, Antoine D. Touboul
Publikováno v:
Aerospace, Vol 7, Iss 2, p 12 (2020)
Due to the intrinsic masking effects of combinational circuits in digital designs, Single-Event Transient (SET) effects were considered irrelevant compared to the data rupture caused by Single-Event Upset (SEU) effects. However, the importance of con
Externí odkaz:
https://doaj.org/article/e03cc6de11ca46b38f5437bd3ff1379f
Publikováno v:
Aerospace, Vol 6, Iss 11, p 119 (2019)
Single event effects (SEEs) in ground level and avionic applications are mainly induced by neutrons and protons, of which the relative contribution of the latter is larger with increasing altitude. Currently, there are two main applicable standards
Externí odkaz:
https://doaj.org/article/2163d1d4e73c463e9dab4aa0798f569c
Autor:
François Ginisty, Frédéric Wrobel, Robert Ecoffet, Denis Standarovski, Julien Mekki, Marine Ruffenach, Nicolas Balcon, Alain Michez
Publikováno v:
IEEE Transactions on Nuclear Science. :1-1
Autor:
Luigi Salvatore Esposito, Giuseppe Lerner, Maris Tali, Alessandro Paccagnella, Oliver Stein, Salvatore Danzeca, Kacper Bilko, Matteo Cecchetto, Carlo Cazzaniga, Simone Gerardin, Yacine Kadi, Cristina Bahamonde Castro, Frédéric Wrobel, Ruben Garcia Alia, M. Brucoli, Marta Bagatin
Publikováno v:
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2020, 67 (7), pp.1412-1420. ⟨10.1109/TNS.2020.2997992⟩
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2020, 67 (7), pp.1412-1420. ⟨10.1109/TNS.2020.2997992⟩
International audience; In addition to high-energy hadrons, which include neutrons, protons, and pions above 20 MeV, thermal neutrons (ThNs) are a major concern in terms of soft error rate (SER) for electronics operating in the large hadron collider
Autor:
Luigi Salvatore Esposito, Salvatore Danzeca, Pedro Martin-Holgado, Dan Alexandrescu, R. Gaillard, Arto Javanainen, Giuseppe Lerner, Heikki Kettunen, Helmut Puchner, Nourdine Kerboub, Maximilien Glorieux, Maria Kastriotou, Vanessa Wyrwoll, Markus Brugger, Cesar Boatella, Frédéric Wrobel, Matteo Cecchetto, Pablo Fernandez-Martinez, Yolanda Morilla, Francesco Cerutti, Andrea Cononetti, Maris Tali, Ruben Garcia Alia, Angelo Infantino, Simone Gilardoni, Veronique Ferlet-Cavrois, Carlo Cazzaniga
Publikováno v:
IEEE Transactions on Nuclear Science
Digital.CSIC. Repositorio Institucional del CSIC
instname
Digital.CSIC. Repositorio Institucional del CSIC
instname
We investigate, through measurements and simulations, the possible direct ionization impact on the accelerator soft-error rate (SER), not considered in standard qualification approaches. Results show that, for a broad variety of state-of-the-art comm