Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Frédéric Vachon"'
Autor:
Frédéric Nolet, Valérie Gauthier, Samuel Parent, Frédéric Vachon, Nicolas Roy, Nicolas St-Jean, Serge A. Charlebois, Jean-François Pratte
Publikováno v:
Instruments, Vol 7, Iss 2, p 16 (2023)
In the field of radiation instrumentation, there is a desire to reach a sub-10 ps FWHM timing resolution for applications such as time-of-flight positron emission tomography, time-of-flight positron computed tomography and time-resolved calorimetry.
Externí odkaz:
https://doaj.org/article/ab86639d6a8f42bfb7565119aa893bb9
Autor:
Simon Carrier, Michel Labrecque-Dias, Ramy Tannous, Pascal Gendron, Frédéric Nolet, Nicolas Roy, Tommy Rossignol, Frédéric Vachon, Samuel Parent, Thomas Jennewein, Serge Charlebois, Jean-François Pratte
Publikováno v:
Sensors, Vol 23, Iss 7, p 3376 (2023)
We present an integrated single-photon detection device custom designed for quantum key distribution (QKD) with time-bin encoded single photons. We implemented and demonstrated a prototype photon-to-digital converter (PDC) that integrates an 8 × 8 s
Externí odkaz:
https://doaj.org/article/791ce6578af74fc59f9e8329e644052d
Autor:
Jean-François Pratte, Frédéric Nolet, Samuel Parent, Frédéric Vachon, Nicolas Roy, Tommy Rossignol, Keven Deslandes, Henri Dautet, Réjean Fontaine, Serge A. Charlebois
Publikováno v:
Sensors, Vol 21, Iss 2, p 598 (2021)
Analog and digital SiPMs have revolutionized the field of radiation instrumentation by replacing both avalanche photodiodes and photomultiplier tubes in many applications. However, multiple applications require greater performance than the current Si
Externí odkaz:
https://doaj.org/article/856819fcfb4a4d7ea4d20cebf444896b
Autor:
Samuel Parent, Frederic Vachon, Valerie Gauthier, Steve Lamoureux, Alexandre Paquette, Jacob Deschamps, Tommy Rossignol, Nicolas Roy, Philippe Arsenault, Henri Dautet, Serge A. Charlebois, Jean-Francois Pratte
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 12, Pp 127-137 (2024)
When developing a technology based on single-photon avalanche diodes (SPADs), the SPAD characterization is mandatory to debug, optimize and monitor the microfabrication process. This is especially true for the development of SPAD arrays 3D integrated
Externí odkaz:
https://doaj.org/article/227b16494c96405e875220c6e2c1c4e0