Zobrazeno 1 - 10
of 189
pro vyhledávání: '"Frédéric Saigné"'
Autor:
Cleiton Marques, Frédéric Wrobel, Ygor Aguiar, Alain Michez, Jérôme Boch, Frédéric Saigné, Rubén García Alía
Publikováno v:
Eng, Vol 5, Iss 1, Pp 319-332 (2024)
This work explains that the Coulomb elastic process on the nucleus is a major source of single-event effects (SEE) for protons within the energy range of 1–10 MeV. The infinite range of Coulomb interactions implies an exceptionally high recoil prob
Externí odkaz:
https://doaj.org/article/99e190c42e154829b9df7c25baca9575
Autor:
Hugo Cintas, Frédéric Wrobel, Marine Ruffenach, Damien Herrera, Frédéric Saigné, Athina Varotsou, Françoise Bezerra, Julien Mekki
Publikováno v:
Aerospace, Vol 10, Iss 3, p 295 (2023)
The device downscaling of electronic components has given rise to the need to consider specific failures in onboard airplane electronics. Single Event Effects (SEE) are a kind of failures that occur due to radiation in the atmosphere. For the purpose
Externí odkaz:
https://doaj.org/article/02f0179eb21f466cbd918c47b24d00bd
Autor:
Ygor Q. Aguiar, Frédéric Wrobel, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Vincent Pouget, Antoine D. Touboul
Publikováno v:
Aerospace, Vol 7, Iss 2, p 12 (2020)
Due to the intrinsic masking effects of combinational circuits in digital designs, Single-Event Transient (SET) effects were considered irrelevant compared to the data rupture caused by Single-Event Upset (SEU) effects. However, the importance of con
Externí odkaz:
https://doaj.org/article/e03cc6de11ca46b38f5437bd3ff1379f
Autor:
Arnaud Meyer, Adriana Morana, Luca Weninger, Nicolas Balcon, Gilles Melin, Julien Mekki, Thierry Robin, André Champavère, Frédéric Saigné, Jérôme Boch, Tadec Maraine, Aomer Aït-Ali-Saïd, Emmanuel Marin, Youcef Ouerdane, Aziz Boukenter, Sylvain Girard
Publikováno v:
IEEE Transactions on Nuclear Science. 70:583-589
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fa701cd66971f2127909b206cd193c79
https://doi.org/10.1109/tns.2022.3226194
https://doi.org/10.1109/tns.2022.3226194
Autor:
Rubén García Alía, Kacper Bilko, Francesco Cerutti, Andrea Coronetti, Natalia Emriskova, Luigi Esposito, Francesc Salvat Pujol, Andreas Waets, Sylvain Girard, Frédéric Saigné, Marco Durante, Christoph Schuy, Tim Wagner
Publikováno v:
IEEE Transactions on Nuclear Science. 70:486-495
Fragmented heavy-ion beams obtained from the interaction of highly energetic ions with thick targets relative to the ion ranges are proposed to mimic the high-penetration linear energy transfer (LET) spectrum present in space and for electronics test
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b9c5380c870f742431bd93ada56cd4ee
https://doi.org/10.1109/tns.2022.3210403
https://doi.org/10.1109/tns.2022.3210403
Autor:
Andrea Coronetti, Rubén García Alía, David Lucsanyi, Jialei Wang, Frédéric Saigné, Arto Javanainen, Paul Leroux, Jeffrey Prinzie
Experimental monoenergetic proton single-event upset (SEU) cross sections of a 65-nm low core-voltage static random access memory (SRAM) were found to be exceptionally high not only at low energies (< 3 MeV), but also at energies $>$ 3 MeV and extend
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::633fb6398c879da3a22458240833b7f1
https://lirias.kuleuven.be/handle/20.500.12942/710576
https://lirias.kuleuven.be/handle/20.500.12942/710576
Fragmented heavy ion beams obtained from the interaction of highly energetic ions with thick targets relative to the ion ranges are proposed to mimic the high-penetration linear energy transfer spectrum present in space and for electronics testing. O
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______2659::c142d3f0f2beca0baff4417bc3bf4f69
https://zenodo.org/record/7640525
https://zenodo.org/record/7640525
Autor:
Frédéric Wrobel, Ygor Aguiar, Cleiton Marques, Giuseppe Lerner, Rubén García Alía, Frédéric Saigné, Jérôme Boch
Publikováno v:
Electronics; Volume 12; Issue 1; Pages: 104
In the atmosphere, it is generally understood that neutrons are the main contributor to the soft error rate (SER) in electronic devices. These particles are indeed able to trigger nuclear reactions in the sensitive regions of the devices, leading to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::da56cdf2a5d96a39646f99e16385f65e
Publikováno v:
Electronics, Vol 11, Iss 378, p 378 (2022)
Electronics; Volume 11; Issue 3; Pages: 378
Electronics; Volume 11; Issue 3; Pages: 378
System-level radiation testing of electronics is evaluated, based on test examples of the System-in-Package (SiP) module irradiations. Total ionizing dose and single event effects tests are analyzed to better understand the opportunities and limitati
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f12d6d0cb59307a5d4858cec7ac6afe6
https://www.mdpi.com/2079-9292/11/3/378
https://www.mdpi.com/2079-9292/11/3/378
Autor:
Vincent Girones, Jérôme Boch, Alain Carapelle, Arnaud Chapon, Tadec Maraine, Timothee Labau, Frédéric Saigné, Rubén García Alía
Publikováno v:
IEEE Transactions on Nuclear Science. :1-1
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2e9a54157715e2aaaf60dea16d30aa4b
https://doi.org/10.1109/tns.2023.3279626
https://doi.org/10.1109/tns.2023.3279626