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pro vyhledávání: '"Fowler, A. W."'
A nut graph is a simple graph for which the adjacency matrix has a single zero eigenvalue such that all non-zero kernel eigenvectors have no zero entry. It is known that infinitely many $d$-regular nut graphs exist for $3 \leq d \leq 12$ and for $d \
Externí odkaz:
http://arxiv.org/abs/2410.14063
Conduction graphs are defined here in order to elucidate at a glance the often complicated conduction behaviour of molecular graphs as ballistic molecular conductors. The graph $G^{\mathrm C}$ describes all possible conducting devices associated with
Externí odkaz:
http://arxiv.org/abs/2409.13518
Autor:
Okumura, T., Azuma, T., Bennett, D. A., Doriese, W. B., Durkin, M. S., Fowler, J. W., Gard, J. D., Hashimoto, T., Hayakawa, R., Ichinohe, Y., Indelicato, P., Isobe, T., Kanda, S., Kato, D., Katsuragawa, M., Kawamura, N., Kino, Y., Kominato, N., Miyake, Y., Morgan, K. M., Noda, H., O'Neil, G. C., Okada, S., Okutsu, K., Paul, N., Reintsema, C. D., Sato, T., Schmidt, D. R., Shimomura, K., Strasser, P., Swetz, D. S., Takahashi, T., Takeda, S., Takeshita, S., Tampo, M., Tatsuno, H., Tőkési, K., Tong, X. M., Toyama, Y., Ullom, J. N., Watanabe, S., Yamada, S., Yamashita, T.
Electronic $K$ x rays emitted by muonic Ar atoms in the gas phase were observed using a superconducting transition-edge-sensor microcalorimeter. The high-precision energy spectra provided a clear signature of the presence of muonic atoms accompanied
Externí odkaz:
http://arxiv.org/abs/2407.07977
Autor:
Szypryt, Paul, Bennett, Douglas A., Florang, Ian Fogarty, Fowler, Joseph W., Giachero, Andrea, Hummatov, Ruslan, Lita, Adriana E., Mates, John A. B., Nam, Sae Woo, O'Neil, Galen C., Swetz, Daniel S., Ullom, Joel N., Vissers, Michael R., Wheeler, Jordan, Gao, Jiansong
Publikováno v:
Communications Engineering, 3, 160, 2024
Single-photon detectors based on the superconducting transition-edge sensor are used in a number of visible to near-infrared applications, particularly for photon-number-resolving measurements in quantum information science. To be practical for large
Externí odkaz:
http://arxiv.org/abs/2405.15017
Autor:
Bašić, Nino, Fowler, Patrick W.
A nut graph is a simple graph of order 2 or more for which the adjacency matrix has a single zero eigenvalue such that all non-zero kernel eigenvectors have no zero entry (i.e. are full). It is shown by construction that every finite group can be rep
Externí odkaz:
http://arxiv.org/abs/2405.04117
Autor:
Fowler, Joseph W., Szypryt, Paul, Bunker, Raymond, Edwards, Ellen R., Florang, Ian Fogarty, Gao, Jiansong, Giachero, Andrea, Hoogerheide, Shannon F., Loer, Ben, Mumm, H. Pieter, Nakamura, Nathan, O'Neil, Galen C., Orrell, John L., Scott, Elizabeth M., Stevens, Jason, Swetz, Daniel S., VanDevender, Brent A., Vissers, Michael, Ullom, Joel N.
Publikováno v:
PRX Quantum, volume 5(4), page 040323 (2024)
Naturally occurring background radiation is a source of correlated decoherence events in superconducting qubits that will challenge error-correction schemes. To characterize the radiation environment in an unshielded laboratory, we performed broadban
Externí odkaz:
http://arxiv.org/abs/2404.10866
A nut graph is a simple graph for which the adjacency matrix has a single zero eigenvalue such that all non-zero kernel eigenvectors have no zero entry. If the isolated vertex is excluded as trivial, nut graphs have seven or more vertices; they are c
Externí odkaz:
http://arxiv.org/abs/2312.03149
Autor:
Szypryt, Paul, Nakamura, Nathan, Becker, Daniel T., Bennett, Douglas A., Dagel, Amber L., Doriese, W. Bertrand, Fowler, Joseph W., Gard, Johnathon D., Harris, J. Zachariah, Hilton, Gene C., Imrek, Jozsef, Jimenez, Edward S., Larson, Kurt W., Levine, Zachary H., Mates, John A. B., McArthur, D., Miaja-Avila, Luis, Morgan, Kelsey M., O'Neil, Galen C., Ortiz, Nathan J., Pappas, Christine G., Schmidt, Daniel R., Thompson, Kyle R., Ullom, Joel N., Vale, Leila, Vissers, Michael R., Walker, Christopher, Weber, Joel C., Wessels, Abigail L., Wheeler, Jason W., Swetz, Daniel S.
Publikováno v:
IEEE Transactions on Applied Superconductivity, vol. 33, no. 5, pp. 1-5, Aug. 2023, Art no. 2100705
We report on the 1,000-element transition-edge sensor (TES) x-ray spectrometer implementation of the TOMographic Circuit Analysis Tool (TOMCAT). TOMCAT combines a high spatial resolution scanning electron microscope (SEM) with a highly efficient and
Externí odkaz:
http://arxiv.org/abs/2212.12073
Autor:
Nakamura, Nathan, Szypryt, Paul, Dagel, Amber L., Alpert, Bradley K., Bennett, Douglas A., Doriese, W. Bertrand, Durkin, Malcolm, Fowler, Joseph W., Fox, Dylan T., Gard, Johnathon D., Goodner, Ryan N., Harris, J. Zachariah, Hilton, Gene C., Jimenez, Edward S., Kernen, Burke L., Larson, Kurt W., Levine, Zachary H., McArthur, Daniel, Morgan, Kelsey M., O'Neil, Galen C., Ortiz, Nathan J., Pappas, Christine G., Reintsema, Carl D., Schmidt, Daniel R., Schultz, Peter A., Thompson, Kyle R., Ullom, Joel N., Vale, Leila, Vaughan, Courtenay T., Walker, Christopher, Weber, Joel C., Wheeler, Jason W., Swetz, Daniel S.
X-ray nanotomography is a powerful tool for the characterization of nanoscale materials and structures, but is difficult to implement due to competing requirements on X-ray flux and spot size. Due to this constraint, state-of-the-art nanotomography i
Externí odkaz:
http://arxiv.org/abs/2212.10591
Autor:
Szypryt, Paul, Bennett, Douglas A., Boone, William J., Dagel, Amber L., Dalton, Gabriella, Doriese, W. Bertrand, Fowler, Joseph W., Garboczi, Edward J., Gard, Johnathon D., Hilton, Gene C., Imrek, Jozsef, Jimenez, Edward S., Kotsubo, Vincent Y., Larson, Kurt, Levine, Zachary H., Mates, John A. B., McArthur, Daniel, Morgan, Kelsey M., Nakamura, Nathan, O'Neil, Galen C., Ortiz, Nathan J., Pappas, Christine G., Reintsema, Carl D., Schmidt, Daniel R., Swetz, Daniel S., Thompson, Kyle R., Ullom, Joel N., Walker, Christopher, Weber, Joel C., Wessels, Abigail L., Wheeler, Jason W.
Publikováno v:
in IEEE Transactions on Applied Superconductivity, vol. 31, no. 5, pp. 1-5, Aug. 2021, Art no. 2100405
Feature sizes in integrated circuits have decreased substantially over time, and it has become increasingly difficult to three-dimensionally image these complex circuits after fabrication. This can be important for process development, defect analysi
Externí odkaz:
http://arxiv.org/abs/2212.07460