Zobrazeno 1 - 10
of 784
pro vyhledávání: '"Fossard F"'
Autor:
Badon, A., Allard, C., Fossard, F., Loiseau, A., Cognet, L., Flahaut, E., Izard, N., Martel, R., Gaufrès, E.
The polarized fluorescence emission of organic fluorophores has been extensively studied in photonics and is increasingly exploited in single molecule scale bio-imaging. Expanding the polarization properties of compact molecular assemblies is, howeve
Externí odkaz:
http://arxiv.org/abs/2101.01410
Autor:
Förster, G. D., Castan, A., Loiseau, A., Nelayah, J., Alloyeau, D., Fossard, F., Bichara, C., Amara, H.
Publikováno v:
Carbon 169, 465 (2020)
Chiral indices determine important properties of carbon nanotubes (CNTs). Unfortunately, their determination from high-resolution transmission electron microscopy (HRTEM) images, the most accurate method for assigning chirality, is a tedious task. We
Externí odkaz:
http://arxiv.org/abs/2003.11505
Autor:
Ottapilakkal, V., Juyal, A., Sundaram, S., Vuong, P., Mballo, A., Beck, L., Nunn, G., Su, Y., Loiseau, A., Fossard, F., Mérot, J.S., Chapron, D., Kauffmann, T.H., Salvestrini, J.P., Voss, P.L., de Heer, W.A., Berger, C., Ougazzaden, A.
Publikováno v:
In Journal of Crystal Growth 1 February 2023 603
Autor:
Benrabah, I.-E., Altinkurt, G., Fèvre, M., Dehmas, M., Denand, B., Fossard, F., Mérot, J.-S., Geandier, G., Locq, D., Perrut, M.
Publikováno v:
In Journal of Alloys and Compounds 5 June 2020 825
Autor:
Favron, A., Gaufrès, E., Fossard, F., Lévesque, P. L., Phaneuf-L'Heureux, A-L., Tang, N. Y-W., Loiseau, A., Leonelli, R., Francoeur, S., Martel, R.
Thin layers of black phosphorus have recently raised interest for their two-dimensional (2D) semiconducting properties, such as tunable direct bandgap and high carrier mobilities. This lamellar crystal of P atoms stacked together by weak van der Waal
Externí odkaz:
http://arxiv.org/abs/1408.0345
Autor:
Allard C; Ecole Polytechnique, Montreal, Canada., Alvarez L; Laboratoire Charles Coulomb, CNRS-Université de Montpellier, France., Bantignies JL; Laboratoire Charles Coulomb, CNRS-Université de Montpellier, France., Bendiab N; CNRS-Université de Grenoble, France., Cambré S; University of Antwerp, Belgium., Campidelli S; CEA-Saclay, France., Fagan JA; National Institute of Standards and Technology (NIST), USA., Flahaut E; CIRIMAT, Université Toulouse 3 Paul Sabatier, Toulouse INP, CNRS, Université de Toulouse, 118 Route de Narbonne, 31062 Toulouse, cedex 9, France., Flavel B; Karlsruhe Institute of Technology (KIT), Germany., Fossard F; Laboratoire d'Étude des Microstructures, CNRS-Onera, Chatillon, France., Gaufrès E; Laboratoire Photonique, Numérique et Nanosciences, CNRS-Université de Bordeaux-IOGS, Talence, France. etienne.gaufres@cnrs.fr., Heeg S; Humboldt-Universität zu Berlin, Germany., Lauret JS; LUMIN, Université Paris Saclay, ENS Paris Saclay, Centrale Supelec, CNRS, Orsay, France., Loiseau A; Laboratoire d'Étude des Microstructures, CNRS-Onera, Chatillon, France., Marceau JB; Laboratoire Photonique, Numérique et Nanosciences, CNRS-Université de Bordeaux-IOGS, Talence, France. etienne.gaufres@cnrs.fr., Martel R; University of Montreal, Canada., Marty L; CNRS-Université de Grenoble, France., Pichler T; University of Vienna, Austria., Voisin C; Université de Paris, Ecole Normale Paris, CNRS, PSL, France., Reich S; Free University of Berlin, Germany., Setaro A; Free University of Berlin, Germany.; Faculty of Engineering and Informatics, Pegaso University, Naples, Italy., Shi L; State Key Laboratory of Optoelectronic Materials and Technologies, Guangdong Basic Research Center of Excellence for Functional Molecular Engineering, Nanotechnology and Research Center, School of Materials Science and Engineering, Sun Yat-sen University, Guangzhou, 510275, China., Wenseleers W; University of Antwerp, Belgium.
Publikováno v:
Chemical Society reviews [Chem Soc Rev] 2024 Aug 12; Vol. 53 (16), pp. 8457-8512. Date of Electronic Publication: 2024 Aug 12.
Autor:
Castan, A., Forel, S., Catala, L., Florea, I., Fossard, F., Bouanis, F., Andrieux-Ledier, A., Mazerat, S., Mallah, T., Huc, V., Loiseau, A., Cojocaru, C.S.
Publikováno v:
In Carbon October 2017 123:583-592
Autor:
Ruby E; Université Paris-Saclay, ENS Paris-Saclay, CentraleSupélec, CNRS, LuMIn (UMR 9024) Gif-sur-Yvette France cedric.mayer@ens-paris-saclay.fr., Levy-Falk H; Université Paris-Saclay, ENS Paris-Saclay, CentraleSupélec, CNRS, LuMIn (UMR 9024) Gif-sur-Yvette France cedric.mayer@ens-paris-saclay.fr., Trippé-Allard G; Université Paris-Saclay, ENS Paris-Saclay, CentraleSupélec, CNRS, LuMIn (UMR 9024) Gif-sur-Yvette France cedric.mayer@ens-paris-saclay.fr., Fossard F; Université Paris-Saclay, ONERA, CNRS, Laboratoire d'étude des Microstructures 92322 Châtillon France., Vallet M; Université Paris-Saclay, CentraleSupélec, CNRS, Laboratoire SPMS (UMR8580) 91190 Gif-sur-Yvette France.; Université Paris-Saclay, ENS Paris-Saclay, CentraleSupélec, CNRS, LMPS - Laboratoire de Mécanique Paris-Saclay (UMR 9026) 91190 Gif-sur-Yvette France., Guiblin N; Université Paris-Saclay, CentraleSupélec, CNRS, Laboratoire SPMS (UMR8580) 91190 Gif-sur-Yvette France., Lauret JS; Université Paris-Saclay, ENS Paris-Saclay, CentraleSupélec, CNRS, LuMIn (UMR 9024) Gif-sur-Yvette France cedric.mayer@ens-paris-saclay.fr., Deleporte E; Université Paris-Saclay, ENS Paris-Saclay, CentraleSupélec, CNRS, LuMIn (UMR 9024) Gif-sur-Yvette France cedric.mayer@ens-paris-saclay.fr., Mayer CR; Université Paris-Saclay, ENS Paris-Saclay, CentraleSupélec, CNRS, LuMIn (UMR 9024) Gif-sur-Yvette France cedric.mayer@ens-paris-saclay.fr.
Publikováno v:
Nanoscale advances [Nanoscale Adv] 2024 Feb 06; Vol. 6 (6), pp. 1704-1719. Date of Electronic Publication: 2024 Feb 06 (Print Publication: 2024).
Autor:
Chiodi, F., Grockowiak, A., Duvauchelle, J.E., Fossard, F., Lefloch, F., Klein, T., Marcenat, C., Débarre, D.
Publikováno v:
In Applied Surface Science 30 May 2014 302:209-212
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