Zobrazeno 1 - 10
of 20
pro vyhledávání: '"Folarin Latinwo"'
Publikováno v:
Entropy, Vol 24, Iss 1, p 27 (2021)
Nonequilibrium work relations have fundamentally advanced our understanding of molecular processes. In recent years, fluctuation theorems have been extensively applied to understand transitions between equilibrium steady-states, commonly described by
Externí odkaz:
https://doaj.org/article/334481b99ee0460da29cf5c879e7ee54
Publikováno v:
DTCO and Computational Patterning II.
Publikováno v:
DTCO and Computational Patterning II.
Autor:
Nikolai D. Petsev, Arash Nikoubashman, Folarin Latinwo, Frank H. Stillinger, Pablo G. Debenedetti
Publikováno v:
The journal of physical chemistry. B. 126(39)
Chiral crystals and their constituent molecules play a prominent role in theories about the origin of biological homochirality and in drug discovery, design, and stability. Although the prediction and identification of stable chiral crystal structure
Autor:
Folarin Latinwo, Yulu Chen, Cheng-En Wu, Peter Brooker, Hyesook Hong, Delian Yang, Hua Song, Kevin Lucas
Publikováno v:
DTCO and Computational Patterning.
Publikováno v:
Optical Microlithography XXXIV.
PTD photoresists are still the main type of photoresists used for tight pitch layers in advanced patterning. Recent experimental results show evidence that the same mechanical deformation behaviors seen in NTD photoresist process also exist in PTD ph
Autor:
Kevin Lucas, Cheng-En (Rich) Wu, Delian Yang, Folarin Latinwo, Peter Brooker, Hua Song, Yulu Chen
Publikováno v:
Optical Microlithography XXXII.
Due to the semiconductor industry’s ever increasing need for finer resolution and improved critical dimension (CD) control, negative tone development (NTD) photoresists (resists) have been adopted for several advanced applications in lithographic p
Autor:
Cheng-En (Rich) Wu, Kevin Lucas, Peter Brooker, Kevin Hooker, Yulu Chen, Marco Guajardo, Folarin Latinwo
Publikováno v:
Design-Process-Technology Co-optimization for Manufacturability XIII.
As feature resolution and process variations continue to shrink for new nodes of both DUV and EUV lithography, the density and number of devices on advanced semiconductor masks continue to increase rapidly. These advances cause significantly increase
Publikováno v:
Photomask Technology 2018.
The model accuracy for Optical Proximity Correction (OPC) and Inverse Lithography Technology (ILT) applications is a critical factor for patterning success in advanced technology nodes. One difficult challenge has been the accurate and fast simulatio
Publikováno v:
The Journal of Chemical Physics. 150:064503
Water exhibits anomalous behavior in its supercooled region. A widely invoked hypothesis to explain supercooled water's thermodynamic anomalies is the existence of a metastable liquid-liquid transition terminating at a critical point. In this work, w