Zobrazeno 1 - 10
of 94
pro vyhledávání: '"Foerster, Daniel"'
Autor:
Qin, Yuan, Wu, Baiyi, Wang, Guangyuan, Song, Pengfei, Förster, Daniel J., Huang, Ming, Yang, Sen
Publikováno v:
In Optics and Laser Technology July 2023 162
Autor:
Paijmans, Johanna L.A., Barlow, Axel, Becker, Matthew S., Cahill, James A., Fickel, Joerns, Förster, Daniel W.G., Gries, Katrin, Hartmann, Stefanie, Havmøller, Rasmus Worsøe, Henneberger, Kirstin, Kern, Christian, Kitchener, Andrew C., Lorenzen, Eline D., Mayer, Frieder, OBrien, Stephen J., von Seth, Johanna, Sinding, Mikkel-Holder S., Spong, Göran, Uphyrkina, Olga, Wachter, Bettina, Westbury, Michael V., Dalén, Love, Bhak, Jong, Manica, Andrea, Hofreiter, Michael
Publikováno v:
In Current Biology 10 May 2021 31(9):1872-1882
Publikováno v:
In Results in Optics May 2021 3
Autor:
Amouye Foumani, Arham, Förster, Daniel J., Ghorbanfekr, Hossein, Weber, Rudolf, Graf, Thomas, Niknam, Ali Reza
Publikováno v:
In Applied Surface Science 30 January 2021 537
Autor:
Schumacher, Stefan, Huttmann, Felix, Petrović, Marin, Witt, Christian, Förster, Daniel F., Vo-Van, Chi, Coraux, Johann, Martínez-Galera, Antonio J., Sessi, Violetta, Vergara, Ignacio, Rückamp, Reinhard, Grüninger, Markus, Schleheck, Nicolas, Heringdorf, Frank Meyer zu, Ohresser, Philippe, Kralj, Marko, Wehling, Tim O., Michely, Thomas
The intercalation of Eu underneath Gr on Ir(111) is comprehensively investigated by microscopic, magnetic, and spectroscopic measurements, as well as by density functional theory. Depending on the coverage, the intercalated Eu atoms form either a $(2
Externí odkaz:
http://arxiv.org/abs/1409.4272
Autor:
Kanitz, Alexander, Förster, Daniel J., Hoppius, Jan S., Weber, Rudolf, Ostendorf, Andreas, Gurevich, Evgeny L.
Publikováno v:
In Applied Surface Science 1 May 2019 475:204-210
Publikováno v:
In Optics and Laser Technology 15 April 2019 112:8-19
Publikováno v:
Sven Macko et al 2010 Nanotechnology 21 085301 (9pp)
We present ion beam erosion experiments performed in ultra high vacuum using a differentially pumped ion source and taking care that the ion beam hits the Si(001) sample only. Under these conditions no ion beam patterns form on Si for angles below 45
Externí odkaz:
http://arxiv.org/abs/0912.0890
Autor:
Förster, Daniel F., Müller, Felix, Giesen, Ulrich, Lindenau, Bernd, Ortmanns, Thorsten, Wolters, Jörg, Pabst, Ulrich, Butzek, Michael, Woracek, Robin, Kozielewski, Tadeusz, Monkenbusch, Michael
Publikováno v:
In Nuclear Inst. and Methods in Physics Research, A 11 November 2018 908:298-308
Autor:
Förster, Daniel J., Faas, Sebastian, Gröninger, Stefan, Bauer, Franziska, Michalowski, Andreas, Weber, Rudolf, Graf, Thomas
Publikováno v:
In Applied Surface Science 15 May 2018 440:926-931