Ion microscopy based on laser-cooled cesium atoms

Autor: Pierre Pillet, G. Khalili, Andrea Fioretti, Maria Allegrini, P. Sudraud, M. Reveillard, B. Rasser, Daniel Comparat, I. Guerri, Matthieu Viteau, Yoann Bruneau, L. Kime, Donatella Ciampini, Francesco Fuso

Publikováno v: Ultramicroscopy (Amst.) 164 (2016): 70–77. doi:10.1016/j.ultramic.2015.12.007
info:cnr-pdr/source/autori:Viteau, M.; Reveillard, M.; Kime, L.; Rasser, B.; Sudraud, P.; Bruneau, Y.; Khalili, G.; Pillet, P.; Comparat, D.; Guerri, I.; Fioretti, A.; Ciampini, D.; Allegrini, M.; Fuso, F./titolo:Ion microscopy based on laser-cooled cesium atoms/doi:10.1016%2Fj.ultramic.2015.12.007/rivista:Ultramicroscopy (Amst.)/anno:2016/pagina_da:70/pagina_a:77/intervallo_pagine:70–77/volume:164

We demonstrate a prototype of a Focused Ion Beam machine based on the ionization of a laser-cooled cesium beam adapted for imaging and modifying different surfaces in the few-tens nanometer range. Efficient atomic ionization is obtained by laser prom

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5d1efe0f25f9811132e80b9db7745a1c
http://hdl.handle.net/11568/782814