Simulation tools for atom probe tomography: A path for diagnosis and treatment of image degradation

Autor: Stefan Parviainen, François Vurpillot, Benoit Gervais, David Zanuttini, Fluyra Djurabekova

Publikováno v: Materials Characterization
Materials Characterization, 2018, 146, pp.336-346. ⟨10.1016/j.matchar.2018.04.024⟩
Materials Characterization, Elsevier, 2018, 146, pp.336-346. ⟨10.1016/j.matchar.2018.04.024⟩

International audience; The ideal picture of a near-perfect 3D microscope often presented regarding Atom Probe Tomography faces several issues. These issues degrade the metrological performance of the instrument and find their roots in the phenomena

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b7bf25e81aaf46142c796a92efdcecd4
https://hal.science/hal-02061494