Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Florio, Fred"'
Publikováno v:
J. Opt. 10, 064001 (2018)
Extraction of non-equilibrium hot carriers generated by plasmon decay in metallic nanostructures is an increasingly exciting prospect for utilizing plasmonic losses, but the search for optimum plasmonic materials with long-lived carriers is ongoing.
Externí odkaz:
http://arxiv.org/abs/1802.00727
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Autor:
Yang Hu1, Florio, Fred1,2, Zhizhong Chen1, Phelan, W. Adam3, Siegler, Maxime A.3, Zhe Zhou1, Yuwei Guo1, Hawks, Ryan1, Jie Jiang1,4, Jing Feng4, Lifu Zhang1, Baiwei Wang1, Yiping Wang1, Gall, Daniel1, Palermo, Edmund F.1, Zonghuan Lu2, Xin Sun2, Toh-Ming Lu2, Hua Zhou5, Yang Ren5
Publikováno v:
Science Advances. 2/26/2020, Vol. 6 Issue 9, p1-9. 9p.
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Autor:
Hu Y; Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, USA., Florio F; Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, USA.; Department of Physics, Rensselaer Polytechnic Institute, Troy, NY 12180, USA., Chen Z; Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, USA., Phelan WA; Department of Chemistry, The Johns Hopkins University, Baltimore, MD 21218, USA., Siegler MA; Department of Chemistry, The Johns Hopkins University, Baltimore, MD 21218, USA., Zhou Z; Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, USA., Guo Y; Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, USA., Hawks R; Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, USA., Jiang J; Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, USA.; Faculty of Materials Science and Engineering, Kunming University of Science and Technology, Kunming, Yunnan 650093, China., Feng J; Faculty of Materials Science and Engineering, Kunming University of Science and Technology, Kunming, Yunnan 650093, China., Zhang L; Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, USA., Wang B; Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, USA., Wang Y; Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, USA., Gall D; Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, USA., Palermo EF; Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, USA., Lu Z; Department of Physics, Rensselaer Polytechnic Institute, Troy, NY 12180, USA., Sun X; Department of Physics, Rensselaer Polytechnic Institute, Troy, NY 12180, USA., Lu TM; Department of Physics, Rensselaer Polytechnic Institute, Troy, NY 12180, USA., Zhou H; X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA., Ren Y; X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA., Wertz E; Department of Physics, Rensselaer Polytechnic Institute, Troy, NY 12180, USA., Sundararaman R; Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, USA.; Department of Physics, Rensselaer Polytechnic Institute, Troy, NY 12180, USA., Shi J; Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180, USA.; Center for Materials, Devices, and Integrated Systems, Rensselaer Polytechnic Institute, Troy, NY 12180, USA.
Publikováno v:
Science advances [Sci Adv] 2020 Feb 28; Vol. 6 (9), pp. eaay4213. Date of Electronic Publication: 2020 Feb 28 (Print Publication: 2020).