Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Florent Cilici"'
Autor:
William R. Eisenstadt, Mark Roos, Devin Morris, Jose Luis Gonzalez-Jimenez, Christopery Mounet, Manuel J. Barragan, Gildas Leger, Florent Cilici, Estelle Lauga-Larroze, Salvador Mir, Sylvain Bourdel, M. Margalef-Rovira, I. Alaji, H. Ghanem, G. Ducournau, C. Gaquiere
Publikováno v:
2022 IEEE European Test Symposium (ETS).
Autor:
Estelle Lauga-Larroze, Florent Cilici, Loic Vincent, Salvador Mir, Manuel J. Barragan, Sylvain Bourdel, Gildas Leger
Publikováno v:
IEEE Transactions on Microwave Theory and Techniques
IEEE Transactions on Microwave Theory and Techniques, Institute of Electrical and Electronics Engineers, 2020, pp.1-1. ⟨10.1109/TMTT.2020.2991412⟩
IEEE Transactions on Microwave Theory and Techniques, Institute of Electrical and Electronics Engineers, 2020, pp.1-1. ⟨10.1109/TMTT.2020.2991412⟩
International audience; In this article, we leverage the power of machine learning algorithms to propose a test methodology for millimeter-wave (mm-wave) integrated circuits. The proposed test strategy is based on identifying the main process degrada
Autor:
Estelle Lauga-Larroze, Salvador Mir, Gildas Leger, Manuel J. Barragan, Florent Cilici, Sylvain Bourdcl
Publikováno v:
2019 16th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)
International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD 2019)
International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD 2019), Jul 2019, Lausanne, Switzerland. pp.17-20, ⟨10.1109/SMACD.2019.8795238⟩
International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD 2019), Jul 2019, Lausanne, Switzerland. pp.17-20
SMACD
International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD 2019)
International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD 2019), Jul 2019, Lausanne, Switzerland. pp.17-20, ⟨10.1109/SMACD.2019.8795238⟩
International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD 2019), Jul 2019, Lausanne, Switzerland. pp.17-20
SMACD
International audience; Millimeter-wave circuits in current nanometric technologies are especially sensitive to process variations, which can seriously degrade the device behavior and reduce fabrication yield. To tackle this issue, conservative desig
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fd4269cf0a326c1656bfb9486bc9fbb1
https://hal.archives-ouvertes.fr/hal-02166246/file/2019-SMACD19_SS2.pdf
https://hal.archives-ouvertes.fr/hal-02166246/file/2019-SMACD19_SS2.pdf
Autor:
Estelle Lauga-Larroze, Salvador Mir, Gildas Leger, Manuel J. Barragan, Sylvain Bourdel, Florent Cilici
Publikováno v:
IEEE International Symposium on Circuits and Systems (ISCAS 2019)
IEEE International Symposium on Circuits and Systems (ISCAS 2019), May 2019, Sapporo, Japan. pp.1-5
ISCAS
IEEE International Symposium on Circuits and Systems (ISCAS 2019), May 2019, Sapporo, Japan. pp.1-5
ISCAS
Integrated millimeter-wave (mm-wave) circuits fabricated in current nanometric processes are especially sensitive to process variations. This issue produces shifts in the circuit performance that may significantly reduce the fabrication yield. In thi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::84f710b5162bc9dbf4a1a94017780068
https://hal.archives-ouvertes.fr/hal-02128847
https://hal.archives-ouvertes.fr/hal-02128847
Publikováno v:
ETS
The functional test of millimeter-wave (mm-wave) circuitry in the production line is a challenging task that requires costly dedicated test equipment and long test times. Machine learning indirect test offers an appealing alternative to standard mm-w