Zobrazeno 1 - 10
of 11
pro vyhledávání: '"Florence Malou"'
Autor:
Arnaud Dufour, Jerome Carron, Francois Pierron, Matthieu Fongral, David Dangla, Guillaume Bascoul, Francoise Bezerra, Julien Mekki, Florence Malou, Pierre Maillard
Publikováno v:
2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a1675277f96163cb4102190a838cb3f1
https://doi.org/10.1109/radecs53308.2021.9954564
https://doi.org/10.1109/radecs53308.2021.9954564
Autor:
Dorian Vert, Michel Pignol, Vincent Lebre, Emmanuel Moutaye, Florence Malou, Jean-Baptiste Begueret
Publikováno v:
Electronics; Volume 11; Issue 21; Pages: 3590
An injection-locked ring oscillator-based phase-locked-loop targeting clock recovery for space application at 3.2 GHz is presented here. Most clock recovery circuits need a very low phase noise and jitter performance and are thus based on LC-type osc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7e24176510a7470d2e79f3509aa29407
https://doi.org/10.3390/electronics11213590
https://doi.org/10.3390/electronics11213590
Publikováno v:
Radiation Effects on Integrated Circuits and Systems for Space Applications ISBN: 9783030046590
This chapter describes one application of CNES (Centre National d’Etudes Spatiales) methodology for allowing using commercial (COTS) digital electronic components in large spacecrafts. The required steps the components have to successfully pass bef
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::febda36d175936d080031e33f1f8fa31
https://doi.org/10.1007/978-3-030-04660-6_12
https://doi.org/10.1007/978-3-030-04660-6_12
Autor:
David Dangla, Pierre Tastet, Robert Ecoffet, Florence Malou, Roberta Pilia, Francoise Bezerra, Denis Standarovski
Publikováno v:
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
This paper reports the results and analysis of various total ionizing dose (TID) and single event effects (SEE) tests. The compendium covers devices tested by CNES from 2011 to 2016. The DUTs employed for the study include memories, microprocessors,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d137d43ea2017e791ef2e170b1c092d2
https://doi.org/10.1109/radecs.2017.8696134
https://doi.org/10.1109/radecs.2017.8696134
Publikováno v:
2014 IEEE Radiation Effects Data Workshop (REDW).
We present Single Event Effects characterization and Total Ionizing Dose behavior up to 300 krad(Si) on Rad-Hardened 1.2GHz PLL IP and cold-spare I/O from new ST CMOS 65nm space technology.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a71a7cab419cd634a5a175d3628d6345
https://doi.org/10.1109/redw.2014.7004601
https://doi.org/10.1109/redw.2014.7004601
Autor:
Sylvain Clerc, Vincent Huard, J.L. Autran, Cyril Bottoni, Gilles Gasiot, Maximilien Glorieux, L. Hili, L. Dugoujon, Florence Malou, J. M. Daveau, F. Cacho, Philippe Roche, R. Weigand, Fady Abouzeid
Publikováno v:
2013 IEEE International Reliability Physics Symposium (IRPS).
Recent space programs have reached the limits of the current space digital ASIC offers, mainly relying on CMOS 180nm. The new ST CMOS 65nm space program described in this paper shows how those limits are overcome. Small modifications to the commercia
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e9bbd46cba5414accceb82869c813bbe
https://doi.org/10.1109/irps.2013.6532051
https://doi.org/10.1109/irps.2013.6532051
Autor:
David Dangla, Florence Malou, W. Falo, J. Garnier, S. Sifflet, J.-F. Pascal, Francoise Bezerra
Publikováno v:
2011 12th European Conference on Radiation and Its Effects on Components and Systems.
We present data on the vulnerability of various candidate spacecraft electronics to total ionizing dose and heavy ion induced single event latch up. Most of the tested devices are commercial integrated circuits, including Analog-to-Digital Converters
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0e83bc702fe4ec7f13e85ae3aabfb9cd
https://doi.org/10.1109/radecs.2011.6131318
https://doi.org/10.1109/radecs.2011.6131318
Publikováno v:
IOLTS
The performance of commercial electronic integrated components with regard to their space qualified counterparts is increasingly attractive for the space domain. This paper presents the required steps the G-Link commercial components from Agilent COT
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8923ff3e11eab8846e861082a0475540
https://doi.org/10.1109/iolts.2010.5560227
https://doi.org/10.1109/iolts.2010.5560227
Publikováno v:
2010 IEEE Radiation Effects Data Workshop.
We present Single Event Effects characterization and Total Ionizing Dose behaviour up to 300 krad(Si) on Rad-Hardened A/D converter.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::85555148113ef107e0c3db4a5e8c0783
https://doi.org/10.1109/redw.2010.5619500
https://doi.org/10.1109/redw.2010.5619500
Publikováno v:
2009 European Conference on Radiation and Its Effects on Components and Systems.
New operational amplifiers have been ELDRS and heavy ions characterized. This paper presents the TID results at high and low dose rate and SEE tests results.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b0f5e71ab89bb85d3b699a2dd66fb001
https://doi.org/10.1109/radecs.2009.5994727
https://doi.org/10.1109/radecs.2009.5994727