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pro vyhledávání: '"Flannigan, David"'
Autor:
Willis, Simon A., Flannigan, David J.
Broader adoption of 4D ultrafast electron microscopy (UEM) for the study of chemical, materials, and quantum systems is being driven by development of new instruments as well as continuous improvement and characterization of existing technologies. Pe
Externí odkaz:
http://arxiv.org/abs/2411.07262
Efforts to push the spatiotemporal imaging-resolution limits of femtosecond (fs) laser-driven ultrafast electron microscopes (UEMs) to the combined angstrom-fs range will benefit from stable sources capable of generating high bunch charges. Recent de
Externí odkaz:
http://arxiv.org/abs/2406.13614
We tested and compared the stability and usability of three different cathode materials and configurations in a thermionic-based ultrafast electron microscope: (1) on-axis thermionic and photoemission from a 0.1-mm diameter LaB6 source with graphite
Externí odkaz:
http://arxiv.org/abs/2404.01434
Akademický článek
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Publikováno v:
In Micron June 2023
Publikováno v:
Philosophical Transactions: Mathematical, Physical and Engineering Sciences, 2020 Dec 01. 378(2186), 1-11.
Externí odkaz:
https://www.jstor.org/stable/27001782
Autor:
Flannigan, David J.
Thesis (Ph. D.)--University of Illinois at Urbana-Champaign, 2006.
Source: Dissertation Abstracts International, Volume: 68-02, Section: B, page: 0993. Adviser: Kenneth S. Suslick. Includes bibliographical references. Available on microfilm from
Source: Dissertation Abstracts International, Volume: 68-02, Section: B, page: 0993. Adviser: Kenneth S. Suslick. Includes bibliographical references. Available on microfilm from
Publikováno v:
Journal of Chemical Physics; 11/14/2022, Vol. 157 Issue 18, p1-11, 11p
Publikováno v:
In Chemical Physics Letters 1 September 2017 683:186-192