Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Fion Yeung"'
Autor:
Yiyang Gao, Jacob Y. Ho, Shu-Tuen Tang, Wanlong Zhang, Man-chun Tseng, Olena Vashchenko, Valerii Vashchenko, Fion Yeung, Hoi-Sing Kwok
Publikováno v:
AIP Advances, Vol 13, Iss 5, Pp 055006-055006-7 (2023)
Azo dyes are valuable functional materials due to their sensitive response to and effective modulation of polarized light. It is essential to find out not only the optical anisotropy but also the complex refractive index of azo dye materials for phot
Externí odkaz:
https://doaj.org/article/2df805146ac841359e82d3ea24a89a63
Publikováno v:
Life. 13:1148
A deep diffractive neural network (D2NN) is a fast optical computing structure that has been widely used in image classification, logical operations, and other fields. Computed tomography (CT) imaging is a reliable method for detecting and analyzing
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8154baf5c57ccd3db903d4a623cfd3cd
https://doi.org/10.3390/life13051148
https://doi.org/10.3390/life13051148
Autor:
Sze Yan Fion Yeung, Sunbin Deng, Yuan Liu, Guoyuan Li, Man Wong, Fan Houbo, Rongsheng Chen, Hoi Sing Kwok, Yuning Qin, Yuming Xu
Publikováno v:
IEEE Transactions on Electron Devices. 67:5537-5543
A novel high gain low-noise analog amplifier based on n-type indium tin oxide (ITO)-stabilized ZnO thin-film transistors (TFTs) was studied in this work. Amplifiers with capacitor bootstrap structure are proposed. The effect of unequal numbers of boo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::50ec2e52230bc8b3f84dd8cde47adccb
https://doi.org/10.1109/ted.2020.3031577
https://doi.org/10.1109/ted.2020.3031577
Autor:
Jianfeng Zhang, Cuiling Meng, Valery V. Vashchenko, Olena V. Vashchenko, Jincheng Huang, Le Jiang, Dingjian Zhou, Rongsheng Chen, Fion Yeung, Hoi‐Sing Kwok, Ping Xu, Guijun Li
Publikováno v:
Advanced Optical Materials. 8:2000980
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c4b895bff67374c2c7d1c1f723a64167
https://doi.org/10.1002/adom.202000980
https://doi.org/10.1002/adom.202000980
Autor:
Fan, Houbo, Li, Guoyuan, Deng, Sunbin, Xu, Yuming, Qin, Yuning, Liu, Yuan, Fion Yeung, Sze Yan, Wong, Man, Kwok, Hoi Sing, Chen, Rongsheng
Publikováno v:
IEEE Transactions on Electron Devices; Dec2020, Vol. 67 Issue 12, p5537-5543, 7p
Publikováno v:
2005 IEEE LEOS Annual Meeting Conference Proceedings; 2005, p515-516, 2p