Zobrazeno 1 - 10
of 124 754
pro vyhledávání: '"Final test"'
Autor:
Kress, Dominik, Müller, David
Publikováno v:
In Computers and Operations Research February 2022 138
Publikováno v:
IEEE Access, Vol 9, Pp 22253-22263 (2021)
In the semiconductor industry, many studies have been carried out for front-end related process improvement and yield prediction using machine learning techniques. However, very few research investigations have dealt with the backend Final Test (FT)
Externí odkaz:
https://doaj.org/article/7e0a076028184f6197da2e3d046b2452
Publikováno v:
IEEE Access, Vol 9, Pp 137655-137666 (2021)
In the semiconductor industry, many previous optimization studies have been carried out at the integrated circuit front-end design phase to identify optimal circuit elements’ size and design parameters. With the scaling of device dimensions, semico
Externí odkaz:
https://doaj.org/article/d9232fafabe04e3b8f66232f90ed8d71
Publikováno v:
IEEE Access, Vol 8, Pp 197885-197895 (2020)
Advanced data analysis tools and techniques are important for semiconductor companies to gain competitive advantage. In particular, yield prediction tools, which fully utilize production data, help to improve operational efficiency and reduce product
Externí odkaz:
https://doaj.org/article/be819a4310574e2d9c1ab5dbc0c6b761
Publikováno v:
International Journal of Production Research. 1/1/2004, Vol. 42 Issue 1, p79-99. 21p. 11 Diagrams, 12 Charts.
Publikováno v:
Arabiyat, Vol 6, Iss 1, Pp 71-92 (2019)
This research is aimed; (a) to give a description about Arabic final semester test questions arrangements procedure at the Faculty of Tarbiyah and Teacher Training in UIN Imam Bonjol Padang. (b) to give a description about the quality of the test as
Externí odkaz:
https://doaj.org/article/dd6d305d07184fffbc5bc52535a867c3
Autor:
Rahmatun Nisa, Cut Mawar Helmanda
Publikováno v:
Getsempena English Education Journal, Vol 7, Iss 1 (2020)
The aim of this study is not only to analyze the model and the items test set by lecturer of Reading Comprehension subject but also the ability of students according to the item questions of each final test. This study analyzes the contents taken fro
Externí odkaz:
https://doaj.org/article/defb5c29aa514a22936c2cec393e116b
Autor:
Chen, James C.1 (AUTHOR), Sun, Cheng-Ju2 (AUTHOR), Chen, Tzu-Li3 (AUTHOR) chentzuli@gmail.com
Publikováno v:
International Journal of Computer Integrated Manufacturing. Dec2015, Vol. 28 Issue 12, p1262-1274. 13p. 7 Diagrams, 4 Charts, 5 Graphs.