Nanostructured coatings of metal containing diamond-like carbon films deposited by femtosecond pulsed laser ablation

Autor: Benchikh, N., Garrelie, F., Donnet, C., Wolski, K., Fillit, R.Y., Rogemond, F., Subtil, J.L., Rouzaud, J.N., Laval, J.Y.

Publikováno v: In Surface & Coatings Technology 2006 200(22):6272-6278

Chapitre Tuners and Filter

Autor: Lucyszyn, S., Elata, D., Leus, V., Lisec, T., Pranonsatit, S., Choi, J.Y., Holmes, A., De Wolf, I., Papaioannou, G., Fillit, R.Y., Fortunier, R., Coccetti, Fabio, Plana, Robert, Tilmans, H., Jourdain, A., De Moor, P., Pothier, Arnaud, Vaha-Heikkila, T., Dussopt, L., Bouchaud, J., Sorrentino, R., Knoblich, B.

Publikováno v: Advanced RF MEMS de
Stepan Lucyszyn. Advanced RF MEMS de, Editions Cambridge University, pp.11, 2010, Advanced RF MEMS, 9780521897716

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::00275327a9a2dc4ef3d53a88fb9d9995
https://hal.science/hal-00620200

Reliability assessment of Solidly Mounted resonators for wireless applications

Autor: Ivira, B., Fillit, R.y, Boussey-Said, J., Parat, G., Ancey, P.

Publikováno v: The Third Student-Organizing Mini-Conference SOIM-COE05 on Information Electronics System
The Third Student-Organizing Mini-Conference SOIM-COE05 on Information Electronics System, 2005, sendai, Japan

International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::cf25e3d6a9df0452ec591bb72c31fec0
https://hal.science/hal-00387284

X Ray diffraction microstructure analysis of ultra precision machined material

Autor: Fillit, R.Y., Revel, P., Khanfir, H.

Publikováno v: Proceedings of the 2nd EUSPEN international conference
2nd EUSPEN international conference
2nd EUSPEN international conference, 2002, Turin, Italy. pp.730-733

International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::c7536836c6148aa6a8f0a747c97b36c4
https://hal.science/hal-00299110

BAW resonators reliability in the GHz range.

Autor: Ivira, B., Fillit, R.Y., Benech, P., Ndagijimana, F., Parat, G., Ancey, P.

Publikováno v: IECON 2006 - 32nd Annual Conference on IEEE Industrial Electronics; 2006, p3133-3138, 6p