Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Filip Lopour"'
Publikováno v:
Scanning. 25:243-246
A new design of secondary electron (SE) detector is described for use in low-vacuum scanning electron microscopes. Its distinguishing feature is a separate detector chamber, which can be maintained at a pressure independent of the pressure in the spe
Publikováno v:
Ultramicroscopy. 146
A novel field-emission SEM column has been developed that features Beam Deceleration Mode, high-probe current and ultra-fast scanning. New detection system in the column is introduced to detect true secondary electron signal. The resolution power at
Publikováno v:
International Symposium for Testing and Failure Analysis.
The standard Ga focused ion beam (FIB) technology is facing challenges because of a request for large volume removal. This is true in the field of failure analysis. This article presents the first combined tool which can fulfill this requirement. Thi
Publikováno v:
Microscopy and Microanalysis. 20:298-299
Publikováno v:
Microscopy and Microanalysis. 19:860-861
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Publikováno v:
Microscopy and Microanalysis. 19:1302-1303
Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Publikováno v:
Microscopy and Microanalysis. 18:652-653
Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Publikováno v:
Microscopy and Microanalysis. 17:906-907
Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
Publikováno v:
Microscopy and Microanalysis. 9:116-117