Zobrazeno 1 - 10
of 58
pro vyhledávání: '"Feustel, F."'
Publikováno v:
In Microelectronic Engineering 2010 87(11):2119-2123
Autor:
Aubel, O., Meyer, M.A., Feustel, F., Engelmann, H.J., Zienert, I., Poppe, J., Schmidt, H., Gehre, D., Geisler, H., Langer, E., Limbecker, P., Foltyn, T., Witt, C., Yao, W., Thierbach, S., Koschinsky, F., Zistl, C.
Publikováno v:
In Microelectronic Engineering 2008 85(10):2042-2046
Publikováno v:
In Sensors & Actuators: A. Physical 2002 99(1):188-193
Autor:
Seidel, R., Bonsdorf, G., Clauss, E., Daleiden, J., Donegan, K., Feustel, F., Hauschildt, M., Hintze, B., Koschinsky, F., Marxsen, G., Naumann, R., Peters, C., Queitsch, U., Talut, G., Theiss, D., Zinke, M.
Publikováno v:
2015 IEEE International Interconnect Technology Conference & 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM); 2015, p9-12, 4p
Autor:
Meyer, M. A., Aubel, O., Feustel, F., Engelmann, H. J., Zienert, I., Poppe, J., Gehre, D., Witt, C.
Publikováno v:
AIP Conference Proceedings; 6/18/2009, Vol. 1143 Issue 1, p97-103, 7p, 2 Black and White Photographs, 2 Diagrams, 4 Graphs
Autor:
Aubel, O., Hohage, J., Feustel, F., Hennesthal, C., Mayer, U., Preusse, A., Nopper, M., Lehr, M.U., Boemmels, J., Wehner, S.
Publikováno v:
2009 IEEE International Reliability Physics Symposium; 2009, p832-836, 5p
Publikováno v:
2009 IEEE International Integrated Reliability Workshop Final Report; 2009, p5-10, 6p
Publikováno v:
2009 IEEE International Integrated Reliability Workshop Final Report; 2009, p60-65, 6p
Publikováno v:
2001 Proceedings 51st Electronic Components & Technology Conference (Cat. No.01CH37220); 2001, p1299-1306, 8p
Publikováno v:
2001 Proceedings 51st Electronic Components & Technology Conference (Cat. No.01CH37220); 2001, p890-902, 13p