Reliability of FeRAM test vehicles under simultaneous electrical and irradiative stresses

Autor: Andreoli, G., Courtade, L., Muller, Ch., Goux, L., Turquat, Ch., Ferrandis, Ph., Wouters, D.

Publikováno v: International Symposium on micro and nanoscale domain structuring in ferroelectrics
International Symposium on micro and nanoscale domain structuring in ferroelectrics, Nov 2005, Ekaterinburg, Russia

International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od______3430::5c74b36f7d93e17f6ab87eaec2b76b28
https://hal.science/hal-03762015

Ferroelectric Bi3.25La0.75Ti3O12 thin films on a conductive Sr4Ru2O9 electrode obtained by pulsed laser deposition

Autor: Chmielowski, R.^1,2 chmielow@univ-tln.fr, Madigou, V.¹, Ferrandis, Ph.¹, Zalecki, R.², Blicharski, M.², Leroux, Ch.¹

Publikováno v: Thin Solid Films. Jun2007, Vol. 515 Issue 16, p6314-6318. 5p.