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pro vyhledávání: '"Fernández, Francisco V."'
Autor:
Diaz-Fortuny, Javier, Saraza-Canflanca, Pablo, Rodriguez, Rosana, Martin-Martinez, Javier, Castro-Lopez, Rafael, Roca, Elisenda, Fernandez, Francisco V., Nafria, Montserrat
Publikováno v:
In Solid State Electronics November 2021 185
Publikováno v:
In AEUE - International Journal of Electronics and Communications January 2021 128
Symbolic analyzers have the potential to offer knowledge to sophomores as well as practitioners of analog circuit design. Actually, they are an essential complement to numerical simulators, since they provide insight into circuit behavior which numer
Publikováno v:
In Microelectronics Journal September 2020 103
Autor:
Diaz-Fortuny, Javier, Martin-Martinez, Javier, Rodriguez, Rosana, Castro-Lopez, Rafael, Roca, Elisenda, Fernandez, Francisco V., Nafria, Montserrat
Publikováno v:
In Solid State Electronics September 2019 159:99-105
Autor:
Ahyoune, Saiyd, Sieiro, Javier, Carrasco, Tomás, Vidal, Neus, López-Villegas, José M., Roca, Elisenda, Fernández, Francisco V.
Publikováno v:
In Integration September 2018 63:332-341
Publikováno v:
In Integration June 2018 62:314-321
Akademický článek
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Publikováno v:
In Integration, the VLSI Journal September 2016 55:357-365
Autor:
Camacho-Ruiz, E., Santana-Andreo, A., Castro-López, R., Roca, Elisenda, Fernández, Francisco V.
Publikováno v:
2022 18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD).
Copyright IEEE
Physical Unclonable Functions (PUFs) use variability as an entropy source from which to generate secure authentication and identification. While most silicon PUFs exploit the well-known Time-Zero Variability of CMOS technologies,
Physical Unclonable Functions (PUFs) use variability as an entropy source from which to generate secure authentication and identification. While most silicon PUFs exploit the well-known Time-Zero Variability of CMOS technologies,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c29c5c734b67412f94a091eb547bc7a6
https://doi.org/10.1109/smacd55068.2022.9816287
https://doi.org/10.1109/smacd55068.2022.9816287