Zobrazeno 1 - 10
of 35
pro vyhledávání: '"Fengjun Duan"'
Publikováno v:
Quality and Reliability Engineering International. 39:1334-1351
Autor:
Fengjun Duan, Guanjun Wang
Publikováno v:
Quality and Reliability Engineering International. 38:957-970
Publikováno v:
Quality and Reliability Engineering International. 38:635-658
Publikováno v:
OCEANS 2022, Hampton Roads.
Autor:
Guanjun Wang, Fengjun Duan
Publikováno v:
Reliability Engineering & System Safety. 217:108104
The basic exponential-dispersion (ED) process can be used to describe many degradation phenomena, but its degradation increments are only age-dependent, which limits its application especially for the phenomena with state-dependent degradation increm
Autor:
Guanjun Wang, Fengjun Duan
Publikováno v:
Computers & Industrial Engineering. 125:467-479
This paper discusses the design problem of the step-stress accelerated degradation test (SSADT) based on the non-stationary gamma process with random effects. The cumulative exposure (CE) model is used to link the degradation paths of the SSADT under
Autor:
Guan-Jun Wang, Fengjun Duan
Publikováno v:
IEEE Transactions on Reliability. 67:1128-1142
The exponential-dispersion (ED) process is a generalized stochastic process, including Wiener, gamma, and inverse Gaussian processes as special cases. This paper studies the reliability evaluation problem for products based on the ED process with ran
Publikováno v:
Reliability Engineering & System Safety. 173:58-63
In this paper, a new reliability model for a multi-state system (MSS) with performance sharing is proposed. The MSS consists of N multi-state units connected in series. Each unit in the system has a random performance level and a random demand. If th
Autor:
Guanjun Wang, Fengjun Duan
Publikováno v:
Communications in Statistics - Theory and Methods. 48:2229-2253
This paper addresses the optimal design problems for constant-stress accelerated degradation test (CSADT) based on gamma processes with fixed effect and random effect. For three optimization criter...
Autor:
Guanjun Wang, Fengjun Duan
Publikováno v:
Journal of Statistical Computation and Simulation. 88:305-328
The purpose of this paper is to address the optimal design of the step-stress accelerated degradation test (SSADT) issue when the degradation process of a product follows the inverse Gaussian (IG) process. For this design problem, an important task i