Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Fengju Gao"'
Autor:
Dongbo Zhao, Fengju Gao, Peiyan Guan, Jiansheng Gao, Zhihui Guo, Jianjun Guo, Huini Cui, Yongjun Li, Guijun Zhang, Zhao Li, Lianghai Guo
Publikováno v:
PeerJ, Vol 11, p e15312 (2023)
Background Trihelix transcription factors play important roles in triggering plant growth and imparting tolerance against biotic and abiotic stresses. However, a systematical analysis of the trihelix transcription factor family under heat and drought
Externí odkaz:
https://doaj.org/article/6ce7befb590c4a0a96178737913c5a97
Publikováno v:
Microorganisms, Vol 11, Iss 5, p 1208 (2023)
The insect gut is home to an extensive array of microbes that play a crucial role in the digestion and absorption of nutrients, as well as in the protection against pathogenic microorganisms. The variety of these gut microbes is impacted by factors s
Externí odkaz:
https://doaj.org/article/cf8b7fec3660436b8639a8aa8e52967a
Autor:
Shun Zhen Feng, Hong Juan Zhou, Xiangfu Nie, Huiyuan Sun, Chengfu Pan, Hongyun Yu, Fengju Gao, Yuping Sun
Publikováno v:
Materials Science Forum. :3737-3740
Granular C/Co/C films have been prepared by magnetron sputtering from C and Co onto glass substrates at room temperature and subsequent in situ annealing. C and Co targets use an RF and DC facing deposition mode respectively. The structural and magne
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f86dbfdfa1107159081914452a90b81b
https://doi.org/10.4028/www.scientific.net/msf.475-479.3737
https://doi.org/10.4028/www.scientific.net/msf.475-479.3737
Publikováno v:
Journal of the Korean Physical Society. 52:24
(XRD) were used to analyze the surface morphology and the microstructure. The surface of the multilayer is continuous and at, with root-mean-square roughness (RMS) of 9.9 nm. The period of the multilayer is 10.7 nm, which is very close to the designe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9eab76fd015434f2990b2d8e271d4707
https://doi.org/10.3938/jkps.52.24
https://doi.org/10.3938/jkps.52.24