Zobrazeno 1 - 10
of 16
pro vyhledávání: '"Feilong Zuo"'
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41:4457-4468
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a884f36ece0e1b3f859605e4a142eee0
https://doi.org/10.1109/tcad.2022.3201471
https://doi.org/10.1109/tcad.2022.3201471
Publikováno v:
DAC
The rapid development of in-vehicle networks and protocols brings efficient communication service but also increases the risk of attack. Any vulnerability may be leveraged to cause serious consequences. It is of vital importance to guarantee their se
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::552d319b5034df133c2633276ed4ae3f
https://doi.org/10.1109/dac18074.2021.9586321
https://doi.org/10.1109/dac18074.2021.9586321
Publikováno v:
ACM Transactions on Embedded Computing Systems. 18:1-22
Industrial Control System (ICS) protocols are widely used to build communications among system components. Compared with common internet protocols, ICS protocols have more control over remote devices by carrying a specific field called “function co
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7b79e56fc4cd0cc63346f9c24fdf8d5a
https://doi.org/10.1145/3358227
https://doi.org/10.1145/3358227
Publikováno v:
DAC: Annual ACM/IEEE Design Automation Conference; 2020, Issue 57, p1322-1327, 6p
Publikováno v:
DAC
Industrial Control System (ICS) protocols play an essential role in building communications among system components. Recently, many severe vulnerabilities, such as Stuxnet and DragonFly, exposed in ICS protocols have affected a wide distribution of d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e16f21b7fa47020f948d70c1f65a11f0
https://doi.org/10.1109/dac18072.2020.9218603
https://doi.org/10.1109/dac18072.2020.9218603
Publikováno v:
ACM Transactions on Embedded Computing Systems; 2019Special Issue, Vol. 18 Issue 5s, p1-22, 22p
Autor:
DianBo Ruan, FeiLong Zuo
Publikováno v:
Electrochemistry. 83:997-999
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::319b4774b54e2b0ef637c66002d490aa
https://doi.org/10.5796/electrochemistry.83.997
https://doi.org/10.5796/electrochemistry.83.997
Autor:
Zhang, Xiaohan1 (AUTHOR) xhzhang1@sjtu.edu.cn, Zhang, Cen2 (AUTHOR) cen001@e.ntu.edu.sg, Li, Xinghua1 (AUTHOR) xhli1@mail.xidian.edu.cn, Du, Zhengjie3 (AUTHOR) dz1833006@smail.nju.edu.cn, Mao, Bing3 (AUTHOR) maobing@nju.edu.cn, Li, Yuekang2 (AUTHOR) yuekang.li@ntu.edu.sg, Zheng, Yaowen2 (AUTHOR) yaowen.zheng@ntu.edu.sg, Li, Yeting4 (AUTHOR) liyeting@iie.ac.cn, Pan, Li5 (AUTHOR) panli@sjtu.edu.cn, Liu, Yang2 (AUTHOR) yangliu@ntu.edu.sg, Deng, Robert6 (AUTHOR) robertdeng@smu.edu.sg
Publikováno v:
ACM Computing Surveys. Feb2025, Vol. 57 Issue 2, p1-36. 36p.
Autor:
Daniele, Cristian1 (AUTHOR) cristian.daniele@ru.nl, Andarzian, Seyed Behnam1 (AUTHOR) seyedbehnam.andarzian@ru.nl, Poll, Erik1 (AUTHOR) erikpoll@cs.ru.nl
Publikováno v:
ACM Computing Surveys. Sep2024, Vol. 56 Issue 9, p1-23. 23p.
Publikováno v:
ACM Transactions on Software Engineering & Methodology; May2024, Vol. 33 Issue 4, p1-26, 26p