Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Feijun Zheng"'
Autor:
Shuang Song, Dehong Wang, Mengyu Li, Siyao Cao, Feijun Zheng, Kai Huang, Zhichao Tan, Sijun Du, Menglian Zhao
Publikováno v:
IEEE Open Journal of Circuits and Systems, Vol 5, Pp 267-290 (2024)
Multiple parameter environment monitoring via wireless Internet of Thing sensors is growing rapidly, thanks to low power techniques of the node. More importantly, the ever more complex and highly efficient energy harvesting systems enable long-term c
Externí odkaz:
https://doaj.org/article/79030e26e272488390018616b9ada1c9
Autor:
Hanming Wu, Feijun Zheng
Publikováno v:
Engineering, Vol 23, Iss , Pp 33-39 (2023)
Externí odkaz:
https://doaj.org/article/61de0799b9c545edb638912e3b1ad20a
Autor:
Mengyu Li, Shuang Song, Dehong Wang, Feijun Zheng, Tian Yang, Yalong Wan, Kai Huang, Zhichao Tan, Menglian Zhao
Publikováno v:
2023 IEEE Custom Integrated Circuits Conference (CICC).
Publikováno v:
Proceedings of the 5th International Conference on Big Data and Education.
Publikováno v:
2021 9th International Conference on Information and Education Technology (ICIET).
Regardless of online or offline learning, there are operational difficulties in “facing all students”, and it is very difficult to pay attention to the “individual differences” between students. As we all know, students are developing people.
Publikováno v:
ITC
We propose a novel methodology for design error diagnosis in the HDL description using a word-level solver. In this approach, the patterns that result in erroneous responses are first used to limit the number of initial error candidates. The RTL desc
Publikováno v:
2007 7th International Conference on ASIC.
This paper presents a sequential equivalence checking (SEC) framework based upon Boolean satisfiability (SAT) related engines such as sequential SAT and invariant checking. By detecting invariants in the miter circuits, the search space can be dramat
Publikováno v:
SoCC
This paper presents a new diagnosis method for locating stuck-at and timing faults in the scan chains. Generating diagnostic patterns for locating the faulty scan cell is formulated as a Boolean Satisfiability (SAT) problem so that any state-of-the-a
Publikováno v:
2008 IEEE International Test Conference; 2008, p1-8, 8p
Publikováno v:
16th Asian Test Symposium (ATS 2007); 2007, p288-294, 7p