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Using the scanning electron microscopy and optical metallography, the formation and redistribution of structural defects in the near-contact silicon layer of thermally untreated Al-n-Si structures resulting from thermoelastic stresses developed under
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1456::1024a0e679233a40257b0dcacc94e383
http://dspace.nbuv.gov.ua/handle/123456789/139698
http://dspace.nbuv.gov.ua/handle/123456789/139698