Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Fedor V. Sharov"'
Autor:
Fedor V. Sharov, Stephen J. Moxim, Gaddi S. Haase, David R. Hughart, Colin G. McKay, Patrick M. Lenahan
Publikováno v:
IEEE Transactions on Device and Materials Reliability. 22:322-331
Publikováno v:
IEEE Transactions on Nuclear Science. 69:208-215
Autor:
Stephen J. Moxim, Fedor V. Sharov, David R. Hughart, Gaddi S. Haase, Colin G. McKay, Elias B. Frantz, Patrick M. Lenhan
Publikováno v:
The Review of scientific instruments. 93(11)
We demonstrate the ability of a relatively new analytical technique, near-zero-field magnetoresistance (NZFMR), to track atomic-scale phenomena involved in the high-field stressing damage of fully processed Si metal-oxide-semiconductor field-effect t
Autor:
Fedor V. Sharov, Stephen. J. Moxim, Patrick M. Lenahan, David R. Hughart, Gaddi S. Haase, Colin. G. McKay
Publikováno v:
2021 IEEE International Integrated Reliability Workshop (IIRW).
Publikováno v:
2020 IEEE International Integrated Reliability Workshop (IIRW).
We report electrically detected magnetic resonance (EDMR) results in $\mathrm{S}\mathrm{i}/\mathrm{S}\mathrm{i}\mathrm{O}_{2}$ metal-oxidesemiconductor field effect transistors before and after high field gate stressing. The measurements utilize EDMR
Autor:
Stephen J. Moxim, Fedor V. Sharov, David R. Hughart, Gaddi S. Haase, Colin G. McKay, Patrick M. Lenahan
Publikováno v:
Applied Physics Letters. 120:063502
Publikováno v:
Review of Scientific Instruments. 93:015104
Rapid-scan electron paramagnetic resonance (RSEPR) results in a significant improvement in signal-to-noise over magnetic field modulated continuous wave EPR (CWEPR). However, the RSEPR raw absorption spectra can make the real-time comparison of CWEPR