Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Federico Galeotti"'
Autor:
Frank W. M. van Otten, Maurangelo Petruzzella, Abbas Mohtashami, Federico Galeotti, Andrea Fiore, Rob W. van der Heijden, Hamed Sadeghian Marnani, Gustav Lindgren
Publikováno v:
Ultramicroscopy, 230:113368. Elsevier
The low throughput of atomic force microscopy (AFM) is the main drawback in its large-scale deployment in industrial metrology. A promising solution would be based on the parallelization of the scanning probe system, allowing acquisition of the image
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3dec6ce3ae5b271adb60fa1ca68fd940
https://doi.org/10.1016/j.ultramic.2021.113368
https://doi.org/10.1016/j.ultramic.2021.113368
Autor:
Federico Galeotti, Andrea Fiore
Publikováno v:
Optics express. 29(10)
Sensing displacements at the nanoscale is the basis for many metrology applications, in particular atomic-force microscopy. Displacement sensing with nano-optomechanical structures provides interesting opportunities for integration, but it typically
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6f1ab99026525388c0fb11c0a17ef2b7
https://pubmed.ncbi.nlm.nih.gov/33985160
https://pubmed.ncbi.nlm.nih.gov/33985160
Autor:
Vadim Pogoretskiy, Andrea Fiore, Maurangelo Petruzzella, F. W. M. van Otten, Tianran Liu, R.W. van der Heijden, Francesco Pagliano, I. Sersic Vollenbroek, H. Sadeghian, Yuqing Jiao, Abbas Mohtashami, P.J. van Veldhoven, Federico Galeotti, Gustav Lindgren
Publikováno v:
Conference on Lasers and Electro-Optics.
In this talk we will present recent process on the integration of nano-opto-electro-mechanical sensors with photonic circuits and optical read-out, showing a route towards fully-integrated optical sensing.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8f0adf8c2d3d77738d03749e04fdd089
https://doi.org/10.1364/cleo_at.2021.jtu1i.4
https://doi.org/10.1364/cleo_at.2021.jtu1i.4
Autor:
Maurangelo Petruzzella, Abbas Mohtashami, Rob W. van der Heijden, Hamed Sadeghian Marnani, Ivana Sersic Vollenbroek, Federico Galeotti, Z. Zobenica, Francesco Pagliano, Andrea Fiore, Frank W. M. van Otten
Publikováno v:
2019 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019
Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019, Munich, Germany, 23-27 June 2019
Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2019, Munich, Germany, 23-27 June 2019
A nano-opto-electro-mechanical transducer for displacement sensing is presented. It consists of a double-membrane photonic crystal cavity integrated with electro-optical read-out and on-chip light-delivery. The operation is demonstrated by atomic for
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::764d3b0ceb245970db1651e39dce8477
http://www.scopus.com/inward/record.url?scp=85074626813&partnerID=8YFLogxK
http://www.scopus.com/inward/record.url?scp=85074626813&partnerID=8YFLogxK
Autor:
Rob W. van der Heijden, Hamed Sadeghian Marnani, Ž. Zobenica, Abbas Mohtashami, Ivana Sersic Vollenbroek, Federico Galeotti, Frank W. M. van Otten, Francesco Pagliano, Maurangelo Petruzzella, Andrea Fiore
Publikováno v:
APL Photonics, 5(2):026103. AIP Publishing LLC
APL Photonics, 2, 5
APL Photonics, 2, 5
Miniaturization of displacement sensors for nanoscale metrology is a key requirement in many applications such as accelerometry, mass sensing, and atomic force microscopy. While optics provides high resolution and bandwidth, integration of sensor rea
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c09e5b9010d27c31837392b965a95a23
https://doi.org/10.1063/1.5131576
https://doi.org/10.1063/1.5131576
Autor:
Maurangelo Petruzzella, Andrea Fiore, Frank W. M. van Otten, Federico Galeotti, Z. Zobenica, Rob W. van der Heijden, Francesco Pagliano, Ivana Sersic-Vollenbroek, Hamed Sadeghian Marnani
Publikováno v:
International Conference on Optical MEMS and Nanophotonics, OMN 2018-Proceedings
23rd International Conference on Optical MEMS and Nanophotonics, OMN 2018, 29 July-2 August 2018
23rd International Conference on Optical MEMS and Nanophotonics, OMN 2018, 29 July-2 August 2018
Displacement sensing at the nanoscale is required in many applications, including accelerometry, mass sensing and atomic force microscopy. Miniaturization of the sensing elements and integration of the read-out is key in achieving low cost, high reso
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b34941e38cf4e3b35a398e4f7bf8f6b7
http://resolver.tudelft.nl/uuid:d95829db-5444-49c2-a3af-e63b085f187d
http://resolver.tudelft.nl/uuid:d95829db-5444-49c2-a3af-e63b085f187d