Zobrazeno 1 - 10
of 112
pro vyhledávání: '"Fault grading"'
Publikováno v:
International Journal of Circuits, Systems and Signal Processing. 15:623-633
Screening out the defects in the TSV manufacturing process and eliminating the resistive open fault and leakage fault as early as possible are beneficial to improve the yield and reliability of 3D ICs. The existing prebond test methods are confined t
Publikováno v:
IEEE Access, Vol 7, Pp 63578-63587 (2019)
The adoption of complex and technologically advanced integrated circuits (ICs) in safety-critical applications (e.g., in automotive) forced the introduction of new solutions to guarantee the achievement of the required reliability targets. One of the
Publikováno v:
ITC-Asia
GPGPU, general-purpose computing on graphics processing units, has been witnessed growing from a niche to a mainstream computing paradigm in the last decade. It is widely deployed in machine learning, artificial intelligence, and many scientific appl
Publikováno v:
VTS
The Controller Area Network (CAN) bus is a serial bus protocol widely used in the automotive domain to allow communication between different Electronic Control Units in the car. Being often part of safety-critical systems, the hardware implementing t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d0d1c8dadfc8051e941e89c349089a70
http://hdl.handle.net/11583/2835252
http://hdl.handle.net/11583/2835252
Publikováno v:
2019 IEEE 3rd International Electrical and Energy Conference (CIEEC).
At present, the amount of data generated by IoT terminal devices has become extremely large. The traditional centralized data processing model centered on the cloud computing model has been unable to support the current power IoT system. This paper p
Autor:
Sarmad Tanwir, Michael S. Hsiao
Publikováno v:
VTS
In this paper, we explore the relationship between fault coverage for sequential circuits and the observed entropy during test application. We find that the entropy measured at a subset of the primary and pseudo-primary outputs is highly and signific
Autor:
Tenentes, Vasileios, Rossi, Daniele, Khursheed, Saqib, Al-Hashimi, Bashir, Chakrabarty, Krishnendu
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Manufacturing defects that do not affect the functional operation of low power Integrated Circuits (ICs) can nevertheless impact their power saving capability. We show that stuck-ON faults on the power switches and resistive bridges between the power
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::dce07bffd69d52ce5fa163bc282034f5
http://livrepository.liverpool.ac.uk/3008302/1/FINAL_VERSION.pdf
http://livrepository.liverpool.ac.uk/3008302/1/FINAL_VERSION.pdf
Publikováno v:
ISQED
Automotive SoCs are constantly being tested for correct functional operation, even long after they have left fabrication. The testing is done at the start of operation (car ignition) and repeatedly during operation (during the drive) to check for fau
Publikováno v:
ETS
This paper examines diagnosis of power switches when the power-distribution-network (PDN) is considered as a high resolution distributed electrical model. The analysis shows that for a diagnosis method to perform high diagnosis accuracy and resolutio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2bab8e8323eb295babd9c18c76d5f2f2
http://hdl.handle.net/11568/1066156
http://hdl.handle.net/11568/1066156
Publikováno v:
Mining Report. 149:5-16
In German coal mining, comprehensive experience is available in the grading of geological faults. The available experience has produced a level of expertise which enables the maintenance of high production figures even under difficult conditions. Thi