Zobrazeno 1 - 10
of 76
pro vyhledávání: '"Farmakis, F.V"'
Autor:
Farmakis, F.V., Speliotis, Th., Alexandrou, K.P., Tsamis, C., Kompitsas, M., Fasaki, I., Jedrasik, P., Petersson, G., Nilsson, B.
Publikováno v:
In Microelectronic Engineering May-June 2008 85(5-6):1035-1038
Publikováno v:
In Microelectronic Engineering May-June 2008 85(5-6):976-978
Publikováno v:
In Thin Solid Films 2007 515(19):7413-7416
Publikováno v:
In Thin Solid Films 15 February 2001 383(1-2):151-153
Publikováno v:
In Solid State Electronics 2000 44(11):2045-2051
Transconductance of large grain excimer laser-annealed polycrystalline silicon thin film transistors
Autor:
Angelis, C.T., Dimitriadis, C.A. *, Farmakis, F.V., Brini, J., Kamarinos, G., Miyasaka, M., Stoemenos, I.
Publikováno v:
In Solid State Electronics 2000 44(6):1081-1087
Autor:
Farmakis, F.V *, Brini, J, Kamarinos, G, Angelis, C.T, Dimitriadis, C.A, Miyasaka, M, Ouisse, T
Publikováno v:
In Solid State Electronics 2000 44(6):913-916
Publikováno v:
In Solid State Electronics 1999 43(7):1259-1266
Publikováno v:
In Microelectronics Reliability 1999 39(6):885-889
Degradation phenomena under the application of a variety of hot-carrier stress conditions were investigated in n-channel top-gate polysilicon thin-film transistors of various channel widths, fabricated by sequential lateral solidification excimer las
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______2127::76fcdb5faf520300480d624859dee868
https://pergamos.lib.uoa.gr/uoa/dl/object/uoadl:3036876
https://pergamos.lib.uoa.gr/uoa/dl/object/uoadl:3036876
