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pro vyhledávání: '"Farhan Ali Qureshi"'
Autor:
Inamullah Sario, Aafia Meherban Kamboh, Ranjeet Kumar Nangdev, Abdul Bari Channa, Muhammad Adil Ansari, Farhan Ali Qureshi
Publikováno v:
2019 2nd International Conference on Computing, Mathematics and Engineering Technologies (iCoMET).
VLSI circuits in automotive fields deal with excessive heat and workload that is why aging of semiconductor devices become rapid that reduces the reliability and life span of the corresponding system. Aging monitoring of such circuits helps avoiding
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7a074932803efdfdb53c5931a4340e62
https://doi.org/10.1109/icomet.2019.8673402
https://doi.org/10.1109/icomet.2019.8673402
