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pro vyhledávání: '"Fantner EJ"'
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Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Autor:
Setiono A; Institute of Semiconductor Technology (IHT), Laboratory of Emerging Nanometrology (LENA), Technische Universität Braunschweig, 38106 Braunschweig, Germany.; Research Center for Physics, Indonesian Institute of Sciences (LIPI), Tangerang Selatan 15314, Indonesia., Fahrbach M; Institute of Semiconductor Technology (IHT), Laboratory of Emerging Nanometrology (LENA), Technische Universität Braunschweig, 38106 Braunschweig, Germany., Deutschinger A; SCL-Sensor.Tech. Fabrication GmbH, 1220 Vienna, Austria., Fantner EJ; SCL-Sensor.Tech. Fabrication GmbH, 1220 Vienna, Austria., Schwalb CH; GETec Microscopy GmbH, 1220 Vienna, Austria., Syamsu I; Institute of Semiconductor Technology (IHT), Laboratory of Emerging Nanometrology (LENA), Technische Universität Braunschweig, 38106 Braunschweig, Germany.; Research Center for Electronics and Telecommunication, Indonesian Institute of Sciences (LIPI), Jl. Sangkuriang-Komplek LIPI Gedung 20, Bandung 40135, Indonesia., Wasisto HS; Institute of Semiconductor Technology (IHT), Laboratory of Emerging Nanometrology (LENA), Technische Universität Braunschweig, 38106 Braunschweig, Germany., Peiner E; Institute of Semiconductor Technology (IHT), Laboratory of Emerging Nanometrology (LENA), Technische Universität Braunschweig, 38106 Braunschweig, Germany.
Publikováno v:
Sensors (Basel, Switzerland) [Sensors (Basel)] 2021 Jun 14; Vol. 21 (12). Date of Electronic Publication: 2021 Jun 14.
Autor:
Setiono A; Institute of Semiconductor Technology (IHT) and Laboratory of Emerging Nanometrology (LENA), Technische Universität Braunschweig, 38106 Braunschweig, Germany.; Research Center for Physics, Indonesian Institute of Sciences (LIPI), 15314 Tangerang Selatan, Indonesia., Bertke M; Institute of Semiconductor Technology (IHT) and Laboratory of Emerging Nanometrology (LENA), Technische Universität Braunschweig, 38106 Braunschweig, Germany., Nyang'au WO; Institute of Semiconductor Technology (IHT) and Laboratory of Emerging Nanometrology (LENA), Technische Universität Braunschweig, 38106 Braunschweig, Germany.; Department of Metrology, Kenya Bureau of Standards (KEBS), 00200 Nairobi, Kenya., Xu J; Institute of Semiconductor Technology (IHT) and Laboratory of Emerging Nanometrology (LENA), Technische Universität Braunschweig, 38106 Braunschweig, Germany., Fahrbach M; Institute of Semiconductor Technology (IHT) and Laboratory of Emerging Nanometrology (LENA), Technische Universität Braunschweig, 38106 Braunschweig, Germany., Kirsch I; Fraunhofer Wilhelm-Klauditz-Institut (WKI), 38108 Braunschweig, Germany., Uhde E; Fraunhofer Wilhelm-Klauditz-Institut (WKI), 38108 Braunschweig, Germany., Deutschinger A; SCL-Sensor.Tech. Fabrication GmbH, 1220 Vienna, Austria., Fantner EJ; SCL-Sensor.Tech. Fabrication GmbH, 1220 Vienna, Austria., Schwalb CH; GETec Microscopy GmbH, 1220 Vienna, Austria., Wasisto HS; Institute of Semiconductor Technology (IHT) and Laboratory of Emerging Nanometrology (LENA), Technische Universität Braunschweig, 38106 Braunschweig, Germany., Peiner E; Institute of Semiconductor Technology (IHT) and Laboratory of Emerging Nanometrology (LENA), Technische Universität Braunschweig, 38106 Braunschweig, Germany.
Publikováno v:
Sensors (Basel, Switzerland) [Sensors (Basel)] 2020 Jan 22; Vol. 20 (3). Date of Electronic Publication: 2020 Jan 22.
Autor:
Kreith J; Department of Material Physics, Montanuniversität Leoben, Jahnstrasse 12, 8700 Leoben, Austria., Strunz T; GETec Microscopy GmbH, Vienna, Austria., Fantner EJ; GETec Microscopy GmbH, Vienna, Austria., Fantner GE; Laboratoray for Bio- and Nano-Instrumentation, EPFL, Lausanne, Switzerland., Cordill MJ; Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Jahnstrasse 12, Leoben 8700, Austria.
Publikováno v:
The Review of scientific instruments [Rev Sci Instrum] 2017 May; Vol. 88 (5), pp. 053704.
Autor:
Leitner M; Institute of Biophysics, Johannes Kepler University, A-4020 Linz, Austria., Fantner GE, Fantner EJ, Ivanova K, Ivanov T, Rangelow I, Ebner A, Rangl M, Tang J, Hinterdorfer P
Publikováno v:
Micron (Oxford, England : 1993) [Micron] 2012 Dec; Vol. 43 (12), pp. 1399-407. Date of Electronic Publication: 2012 Jun 03.
Autor:
Kuchar F; Institut fuP;ur Festkorperphysik, Universitat Wien, A-1090 Vienna and Ludwig Boltzmann Institut für Festkorperphysik, a-1060 Vienna, Austria., Veigl K, Fantner EJ
Publikováno v:
The Review of scientific instruments [Rev Sci Instrum] 1979 Feb; Vol. 50 (2), pp. 245.
Publikováno v:
Physical review. B, Condensed matter [Phys Rev B Condens Matter] 1985 Jun 15; Vol. 31 (12), pp. 7958-7978.