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pro vyhledávání: '"Fanling H. Yang"'
Publikováno v:
SPIE Proceedings.
The Tektronix CCD Manufacturing Group has applied their thinning back surface enhancement and anti-reflection coating processes to produce a 1024 by 1024 chargecoupled device imager with high quantum efficiency (QE) from 350 to 1 100 nm. The TK1O24AB
Autor:
Fanling H. Yang, Morley M. Blouke, M. L. Lust, James R. Janesick, M. Winzenread, Denis L. Heidtmann, Harry H. Marsh, Brian L. Corrie
Publikováno v:
Optical Engineering. 26
The performance requirements for scientific-quality CCDs are discussed, focusing on the design of two devices, and the progress toward achieving the desired performance is discussed. These devices are intended for rear-illuminated applications and ha
Publikováno v:
Instrumentation for Ground-Based Optical Astronomy ISBN: 9781461283874
Defects which collect charge and then release it into subsequent pixels are the major problem facing CCD users and manufacturers. These defects are categorized loosely into three groups: design, material, and processing induced traps. This paper disc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2a5b6ccc89d1b91a05e8fdae8509ec04
https://doi.org/10.1007/978-1-4612-3880-5_45
https://doi.org/10.1007/978-1-4612-3880-5_45
Autor:
Harry H. Marsh, Brian L. Corrie, Morley M. Blouke, Denis L. Heidtmann, Fanling H. Yang, Larry D. Riley
Publikováno v:
SPIE Proceedings.
Detailed measurements and characterization of trap behavior in large area CCDs have been performed. The effect of these defects is to cause a local decrease in the charge transfer efficiency in the affected pixel. Bias-temperature stressing of the de
Conference
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