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Akademický článek
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Akademický článek
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Autor:
Back TC; University of Dayton Research Institute, 300 College Park, Dayton, OH 45469-0170, USA; Air Force Research Laboratory, Materials and Manufacturing Directorate, 3005 Hobson Way, Wright-Patterson Air Force Base, OH 45433, USA. Electronic address: tyson.back@udri.udayton.edu., Schmid AK; NCEM, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA., Fairchild SB; Air Force Research Laboratory, Materials and Manufacturing Directorate, 3005 Hobson Way, Wright-Patterson Air Force Base, OH 45433, USA., Boeckl JJ; Air Force Research Laboratory, Materials and Manufacturing Directorate, 3005 Hobson Way, Wright-Patterson Air Force Base, OH 45433, USA., Cahay M; Spintronics and Vacuum Nanoelectronics Laboratory, University of Cincinnati, Cincinnati, OH 45221, USA., Derkink F; NCEM, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA; Physics of Interfaces and Nanomaterials, MESA+ Institute for Nanotechnology, University of Twente, P.O. Box 217, 7500 AE, Enschede, The Netherlands., Gong C; NCEM, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA., Sayir A; NASA Glenn Research Center, Cleveland, OH 44135, USA.
Publikováno v:
Ultramicroscopy [Ultramicroscopy] 2018 May; Vol. 188, pp. 102.
Autor:
Back TC; University of Dayton Research Institute, 300 College Park, Dayton, OH 45469-0170, USA; Air Force Research Laboratory, Materials and Manufacturing Directorate, 3005 Hobson Way, Wright-Patterson Air Force Base, OH 45433, USA. Electronic address: tyson.back@udri.udayton.edu., Schmid AK; NCEM, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA., Fairchild SB; Air Force Research Laboratory, Materials and Manufacturing Directorate, 3005 Hobson Way, Wright-Patterson Air Force Base, OH 45433, USA., Boeckl JJ; Air Force Research Laboratory, Materials and Manufacturing Directorate, 3005 Hobson Way, Wright-Patterson Air Force Base, OH 45433, USA., Cahay M; Spintronics and Vacuum Nanoelectronics Laboratory, University of Cincinnati, Cincinnati, OH 45221, USA., Derkink F; NCEM, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA; Physics of Interfaces and Nanomaterials, MESA+ Institute for Nanotechnology, University of Twente, P.O. Box 217, 7500 AE, Enschede, The Netherlands., Chen G; NCEM, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA., Sayir A; NASA Glenn Research Center, Cleveland, OH 44135, USA.
Publikováno v:
Ultramicroscopy [Ultramicroscopy] 2017 Dec; Vol. 183, pp. 67-71. Date of Electronic Publication: 2017 May 10.
Autor:
Park J; Air Force Research Laboratory, Materials and Manufacturing Directorate (AFRL/RXA) Wright-Patterson AFB, OH 45433-7707., Back T; Air Force Research Laboratory, Materials and Manufacturing Directorate (AFRL/RXA) Wright-Patterson AFB, OH 45433-7707.; University of Dayton Research Institute, Dayton, Ohio 45469-0170, USA.; Center of Excellence for Thin Film Research and Surface Engineering, University of Dayton, Dayton, Ohio 45469-0170, USA., Mitchel WC; Air Force Research Laboratory, Materials and Manufacturing Directorate (AFRL/RXA) Wright-Patterson AFB, OH 45433-7707., Kim SS; Air Force Research Laboratory, Materials and Manufacturing Directorate (AFRL/RXA) Wright-Patterson AFB, OH 45433-7707., Elhamri S; Departments of Physics, University of Dayton, Dayton, Ohio 45469., Boeckl J; Air Force Research Laboratory, Materials and Manufacturing Directorate (AFRL/RXA) Wright-Patterson AFB, OH 45433-7707., Fairchild SB; Air Force Research Laboratory, Materials and Manufacturing Directorate (AFRL/RXA) Wright-Patterson AFB, OH 45433-7707., Naik R; Air Force Research Laboratory, Materials and Manufacturing Directorate (AFRL/RXA) Wright-Patterson AFB, OH 45433-7707., Voevodin AA; Air Force Research Laboratory, Materials and Manufacturing Directorate (AFRL/RXA) Wright-Patterson AFB, OH 45433-7707.
Publikováno v:
Scientific reports [Sci Rep] 2015 Sep 23; Vol. 5, pp. 14374. Date of Electronic Publication: 2015 Sep 23.
Autor:
Fairchild SB; Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, OH 45433, USA., Boeckl J, Back TC, Ferguson JB, Koerner H, Murray PT, Maruyama B, Lange MA, Cahay MM, Behabtu N, Young CC, Pasquali M, Lockwood NP, Averett KL, Gruen G, Tsentalovich DE
Publikováno v:
Nanotechnology [Nanotechnology] 2015 Mar 13; Vol. 26 (10), pp. 105706. Date of Electronic Publication: 2015 Feb 19.
Autor:
Back T; Air Force Research Laboratory, Materials and Manufacturing Directorate, Wright-Patterson Air Force Base , 3005 Hobson Way, Ohio 45433, United States., Fairchild SB, Averett K, Maruyama B, Pierce N, Cahay M, Murray PT
Publikováno v:
ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2013 Sep 25; Vol. 5 (18), pp. 9241-6. Date of Electronic Publication: 2013 Sep 16.
Autor:
Behabtu N; Department of Chemical and Biomolecular Engineering, Applied Physics Program, The Smalley Institute for Nanoscale Science and Technology, Rice University, Houston, TX 77005, USA., Young CC, Tsentalovich DE, Kleinerman O, Wang X, Ma AW, Bengio EA, ter Waarbeek RF, de Jong JJ, Hoogerwerf RE, Fairchild SB, Ferguson JB, Maruyama B, Kono J, Talmon Y, Cohen Y, Otto MJ, Pasquali M
Publikováno v:
Science (New York, N.Y.) [Science] 2013 Jan 11; Vol. 339 (6116), pp. 182-6.
Publikováno v:
Psychophysiology [Psychophysiology] 1987 May; Vol. 24 (3), pp. 312-9.