Zobrazeno 1 - 10
of 85
pro vyhledávání: '"Failure modes of electronics"'
Autor:
Zhaonian Yang, Panqi Gao
Publikováno v:
IEEE Access, Vol 8, Pp 158273-158280 (2020)
In this paper, a tunnel field-effect transistor (TFET)-based voltage detector is proposed and its electrical characteristics are investigated using technology computer-aided design (TCAD) simulation. The operating principle of the proposed voltage de
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::51d779ad7ad983e9c9bdace324c6103e
https://ieeexplore.ieee.org/document/9179772/
https://ieeexplore.ieee.org/document/9179772/
Autor:
Chao-Yang Ke, Ming-Dou Ker
Publikováno v:
IRPS
In USB type-C interface, owing to the shrinking space between the pins of connector and the required high-power delivery, the electrical overstress (EOS) events due to some pins shorting to V BUS pin during plugging or unplugging operations had been
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3b620955e757a6b36105dcc8d4e8b8f8
https://doi.org/10.1109/irps45951.2020.9129160
https://doi.org/10.1109/irps45951.2020.9129160
Publikováno v:
IEEE Transactions on Device and Materials Reliability. 18:391-396
With this paper, we review several different failure mechanisms of commercial light emitting diodes operating in real-life applications. We consider both high power and mid power devices, which represent the biggest share of the market. Real-life app
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fe22e719fd7ed3cc49510b05a71d4035
https://doi.org/10.1109/tdmr.2018.2852000
https://doi.org/10.1109/tdmr.2018.2852000
Autor:
Chunlei Wu
Publikováno v:
Microelectronics Reliability. :203-207
For identifying the real failure root cause of so called EOS cases, a new term “Electrically Induced Physical Damage (EIPD)” has been published by JEDEC JEP174 in 2016. In JEP174, the failure root cause of EIPD could not be determined as EOS simp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c26624c6912bc8f56d6eae1eb5273c5a
https://doi.org/10.1016/j.microrel.2018.07.011
https://doi.org/10.1016/j.microrel.2018.07.011
Autor:
Enrico Zanoni, Nicola Renso, Matteo Buffolo, Gaudenzio Meneghesso, C. De Santi, Matteo Meneghini, M. Ronzani
Publikováno v:
Microelectronics Reliability. :887-890
This work presents the analysis of the degradation mechanisms and of the electro-optical characteristics of light emitting diodes (LEDs) submitted to electrical overstress. The analysis was carried out by a custom-setup, that allows us to measure the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cda1f0edbead3735f65db53142d4bfcf
https://doi.org/10.1016/j.microrel.2018.06.054
https://doi.org/10.1016/j.microrel.2018.06.054
Autor:
Em Julius De La Cruz
Publikováno v:
2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA).
Root cause determination of electrical overstress (EOS) failures has become significantly important because of the automotive industry's continual quest for quality improvement. The determination of EOS as the failure type in a defective IC is import
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6142c4a5e3402b95d1e0e0d14299f288
https://doi.org/10.1109/ipfa47161.2019.8984756
https://doi.org/10.1109/ipfa47161.2019.8984756
Publikováno v:
2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA).
Damages from Electrical Overstress (EOS) are the leading reason of returns of integrate circuits and systems that have failed in PCB assembly or final field. While a wide variety of root causes could result to EOS damage, it is difficult for analyzer
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::43c697e608f43ee7950f1791b9055663
https://doi.org/10.1109/ipfa47161.2019.8984859
https://doi.org/10.1109/ipfa47161.2019.8984859
Autor:
Peter Majewicz
Publikováno v:
2019 IEEE Aerospace Conference.
Aerospace electrical systems are required to withstand and adequately operate in extremely harsh environments that include, for example, high radiation exposure, temperature extremes, intense vibrational stress and drastic temperature cycling. The na
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7ef49d3fc96ac9da21a0e29768d4acc0
https://doi.org/10.1109/aero.2019.8741686
https://doi.org/10.1109/aero.2019.8741686
Publikováno v:
Sensors and Materials. 32:1889
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c64f47462c9169f8ddf3d96cd29bed0b
https://doi.org/10.18494/sam.2020.2542
https://doi.org/10.18494/sam.2020.2542