Zobrazeno 1 - 1
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pro vyhledávání: '"Failure Log Selection"'
Autor:
Tanwir, Sarmad
The test process for semiconductor devices involves generation and application of test patterns, failure logging and diagnosis. Traditionally, most of these activities cater for all possible faults without making any assumptions about the actual defe
Externí odkaz:
http://hdl.handle.net/10919/82736
